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- W2771888356 abstract "RF CMOS technology provides a platform for the production of analog, digital and RF circuits on a single chip for futuristic high-level integration. This facilitates the need for a robust compact model for RF FinFETs to study the circuits in a precise and convenient way. In this paper, we have characterized 14-nm N-channel bulk FinFETs by performing two-port S-parameter measurements. Further, BSIM-CMG model for common multiple gate devices is used to accurately capture the RF behavior of the device." @default.
- W2771888356 created "2017-12-22" @default.
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- W2771888356 date "2017-10-01" @default.
- W2771888356 modified "2023-09-27" @default.
- W2771888356 title "Characterization and modeling of N-channel bulk FinFETs from DC to high frequency" @default.
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- W2771888356 doi "https://doi.org/10.1109/edssc.2017.8126567" @default.
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