FRINK Linked Data Fragments server

Matches in SemOpenAlex for { <https://semopenalex.org/work/W2778200318> ?p ?o ?g. }

• W2778200318 endingPage "153" @default.
• W2778200318 startingPage "143" @default.
• W2778200318 abstract "We conducted a numerical analysis on high-K dielectric passivated AlGaN/GaN Schottky barrier diodes (HPG-SBDs) with a gated edge termination (GET). The reverse blocking characteristics were significantly enhanced without the stimulation of any parasitic effect by varying the dielectric thickness dge under the GET, thickness TP, and dielectric constant εr of the high-K passivation layer. The leakage current was reduced by increasing εr and decreasing dge. The breakdown voltage of the device was enhanced by increasing εr and TP. The highest breakdown voltage of 970 V and the lowest leakage current of 0.5 nA/mm were achieved under the conditions of εr = 80, TP = 800 nm, and dge = 10 nm. C-V simulation revealed that the HPG-SBDs induced no parasitic capacitance by comparing the integrated charges of the devices with different high-K dielectrics and different dge." @default.
• W2778200318 created "2018-01-05" @default.
• W2778200318 creator A5037053457 @default.
• W2778200318 creator A5048674643 @default.
• W2778200318 creator A5073979128 @default.
• W2778200318 creator A5076072917 @default.
• W2778200318 creator A5084781002 @default.
• W2778200318 date "2018-02-01" @default.
• W2778200318 modified "2023-09-27" @default.
• W2778200318 title "Numerical analysis of the reverse blocking enhancement in High-K passivation AlGaN/GaN Schottky barrier diodes with gated edge termination" @default.
• W2778200318 cites W1598255599 @default.
• W2778200318 cites W1674821110 @default.
• W2778200318 cites W1965052718 @default.
• W2778200318 cites W1965625572 @default.
• W2778200318 cites W1970986621 @default.
• W2778200318 cites W1971958003 @default.
• W2778200318 cites W1979322420 @default.
• W2778200318 cites W1989210356 @default.
• W2778200318 cites W2010190896 @default.
• W2778200318 cites W2019769678 @default.
• W2778200318 cites W2023353733 @default.
• W2778200318 cites W2024121067 @default.
• W2778200318 cites W2052021357 @default.
• W2778200318 cites W2093779437 @default.
• W2778200318 cites W2122223552 @default.
• W2778200318 cites W2202052477 @default.
• W2778200318 cites W2278830795 @default.
• W2778200318 cites W2310118664 @default.
• W2778200318 cites W2488134110 @default.
• W2778200318 cites W2517612444 @default.
• W2778200318 cites W2549432911 @default.
• W2778200318 cites W2580496947 @default.
• W2778200318 cites W2740159392 @default.
• W2778200318 doi "https://doi.org/10.1016/j.spmi.2017.12.026" @default.
• W2778200318 hasPublicationYear "2018" @default.
• W2778200318 type Work @default.
• W2778200318 sameAs 2778200318 @default.
• W2778200318 citedByCount "2" @default.
• W2778200318 countsByYear W27782003182018 @default.
• W2778200318 countsByYear W27782003182020 @default.
• W2778200318 crossrefType "journal-article" @default.
• W2778200318 hasAuthorship W2778200318A5037053457 @default.
• W2778200318 hasAuthorship W2778200318A5048674643 @default.
• W2778200318 hasAuthorship W2778200318A5073979128 @default.
• W2778200318 hasAuthorship W2778200318A5076072917 @default.
• W2778200318 hasAuthorship W2778200318A5084781002 @default.
• W2778200318 hasConcept C119321828 @default.
• W2778200318 hasConcept C119599485 @default.
• W2778200318 hasConcept C127413603 @default.
• W2778200318 hasConcept C133386390 @default.
• W2778200318 hasConcept C139719470 @default.
• W2778200318 hasConcept C147789679 @default.
• W2778200318 hasConcept C154318817 @default.
• W2778200318 hasConcept C159985019 @default.
• W2778200318 hasConcept C16115445 @default.
• W2778200318 hasConcept C162324750 @default.
• W2778200318 hasConcept C165801399 @default.
• W2778200318 hasConcept C17525397 @default.
• W2778200318 hasConcept C185592680 @default.
• W2778200318 hasConcept C192562407 @default.
• W2778200318 hasConcept C205200001 @default.
• W2778200318 hasConcept C20615193 @default.
• W2778200318 hasConcept C2777042071 @default.
• W2778200318 hasConcept C2779227376 @default.
• W2778200318 hasConcept C30066665 @default.
• W2778200318 hasConcept C33574316 @default.
• W2778200318 hasConcept C49040817 @default.
• W2778200318 hasConcept C78434282 @default.
• W2778200318 hasConceptScore W2778200318C119321828 @default.
• W2778200318 hasConceptScore W2778200318C119599485 @default.
• W2778200318 hasConceptScore W2778200318C127413603 @default.
• W2778200318 hasConceptScore W2778200318C133386390 @default.
• W2778200318 hasConceptScore W2778200318C139719470 @default.
• W2778200318 hasConceptScore W2778200318C147789679 @default.
• W2778200318 hasConceptScore W2778200318C154318817 @default.
• W2778200318 hasConceptScore W2778200318C159985019 @default.
• W2778200318 hasConceptScore W2778200318C16115445 @default.
• W2778200318 hasConceptScore W2778200318C162324750 @default.
• W2778200318 hasConceptScore W2778200318C165801399 @default.
• W2778200318 hasConceptScore W2778200318C17525397 @default.
• W2778200318 hasConceptScore W2778200318C185592680 @default.
• W2778200318 hasConceptScore W2778200318C192562407 @default.
• W2778200318 hasConceptScore W2778200318C205200001 @default.
• W2778200318 hasConceptScore W2778200318C20615193 @default.
• W2778200318 hasConceptScore W2778200318C2777042071 @default.
• W2778200318 hasConceptScore W2778200318C2779227376 @default.
• W2778200318 hasConceptScore W2778200318C30066665 @default.
• W2778200318 hasConceptScore W2778200318C33574316 @default.
• W2778200318 hasConceptScore W2778200318C49040817 @default.
• W2778200318 hasConceptScore W2778200318C78434282 @default.
• W2778200318 hasFunder F4320321001 @default.
• W2778200318 hasLocation W27782003181 @default.
• W2778200318 hasOpenAccess W2778200318 @default.
• W2778200318 hasPrimaryLocation W27782003181 @default.
• W2778200318 hasRelatedWork W1528733078 @default.
• W2778200318 hasRelatedWork W1898869797 @default.
• W2778200318 hasRelatedWork W2077748825 @default.
• W2778200318 hasRelatedWork W2089852166 @default.

• next