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• W2783169296 abstract "In this study, based on the pressure blister test technique, a theoretical study on the synchronous characterization of surface and interfacial mechanical properties of thin-film/substrate systems with residual stress was presented, where the problem of axisymmetric deformation of a blistering film with initial stress was analytically solved and its closed-form solution was presented. The expressions to determine Poisson’s ratios, Young’s modulus, and residual stress of surface thin films were derived; the work done by the applied external load and the elastic energy stored in the blistering thin film were analyzed in detail and their expressions were derived; and the interfacial adhesion energy released per unit delamination area of thin-film/substrate (i.e., energy release rate) was finally presented. The synchronous characterization technique presented here has theoretically made a big step forward, due to the consideration for the residual stress in surface thin films." @default.
• W2783169296 created "2018-01-26" @default.
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• W2783169296 date "2018-01-07" @default.
• W2783169296 modified "2023-10-14" @default.
• W2783169296 title "Theoretical Study on Synchronous Characterization of Surface and Interfacial Mechanical Properties of Thin-Film/Substrate Systems with Residual Stress Based on Pressure Blister Test Technique" @default.
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• W2783169296 doi "https://doi.org/10.3390/polym10010049" @default.
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• W2783169296 hasPublicationYear "2018" @default.
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