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- W2788394059 abstract "The influence of 1.5 MeV electron irradiation on minority transport properties of Si doped β-Ga2O3 vertical Schottky rectifiers was observed for fluences up to 1.43 × 1016 cm−2. The Electron Beam-Induced Current technique was used to determine the minority hole diffusion length as a function of temperature for each irradiation dose. This revealed activation energies related to shallow donors at 40.9 meV and radiation-induced defects with energies at 18.1 and 13.6 meV. Time-resolved cathodoluminescence measurements showed an ultrafast 210 ps decay lifetime and reduction in carrier lifetime with increased irradiation." @default.
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- W2788394059 date "2018-02-19" @default.
- W2788394059 modified "2023-09-27" @default.
- W2788394059 title "Effect of 1.5 MeV electron irradiation on β-Ga2O3 carrier lifetime and diffusion length" @default.
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- W2788394059 doi "https://doi.org/10.1063/1.5011971" @default.
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