Matches in SemOpenAlex for { <https://semopenalex.org/work/W2798850132> ?p ?o ?g. }
Showing items 1 to 96 of
96
with 100 items per page.
- W2798850132 abstract "CMOS technology scaling has made the increase of transistor density in Systems-on-Chip (SoC) possible. In addition, the necessity of storing more and more information has resulted in the fact that Static Random Access Memories (SRAMs) have become great part of the SoC's silicon area. This miniaturization brings up several benefits, among them an increase of system performance. However, some undesirable behaviors, that did not exist or that were negligible, now became reality. Manufacturing process variation has introduced new types of defects, such as: (1) Resistive-Open defects and (2) Resistive-Bridge defects, which depending on their size can cause static or dynamic faults. Indeed, the circuit's sensibility to environmental noise is another challenge related to technology scaling. In more detail, the interference can damage the circuit behavior and cause Single Event Upsets (SEUs), affecting the circuit's reliability. Given these circumstances, this work proposes a hardware-based methodology able to detect resistive defects as well as to monitor defective cells in field aiming to detect SEUs. The fundamental idea is to use part of the hardware introduced to perform the manufacturing test to also detect bit-flips during the circuit's lifetime. Note that only SRAM cells with weak resistive defects are monitored, since the cells with strong defects that propagate static faults are isolated after manufacturing test. The proposed work has been validated and evaluated through SPICE simulations adopting an SRAM array modeled with a commercial 65nm CMOS technology library." @default.
- W2798850132 created "2018-05-07" @default.
- W2798850132 creator A5002455574 @default.
- W2798850132 creator A5051665033 @default.
- W2798850132 creator A5056273734 @default.
- W2798850132 creator A5082396421 @default.
- W2798850132 date "2018-03-01" @default.
- W2798850132 modified "2023-09-26" @default.
- W2798850132 title "A hardware-based approach for SEU monitoring in SRAMs with weak resistive defects" @default.
- W2798850132 cites W1637395447 @default.
- W2798850132 cites W1958909498 @default.
- W2798850132 cites W1968564509 @default.
- W2798850132 cites W1978331730 @default.
- W2798850132 cites W2011949301 @default.
- W2798850132 cites W2049791893 @default.
- W2798850132 cites W2061114598 @default.
- W2798850132 cites W2099911327 @default.
- W2798850132 cites W2125169487 @default.
- W2798850132 cites W2541366912 @default.
- W2798850132 doi "https://doi.org/10.1109/latw.2018.8349667" @default.
- W2798850132 hasPublicationYear "2018" @default.
- W2798850132 type Work @default.
- W2798850132 sameAs 2798850132 @default.
- W2798850132 citedByCount "0" @default.
- W2798850132 crossrefType "proceedings-article" @default.
- W2798850132 hasAuthorship W2798850132A5002455574 @default.
- W2798850132 hasAuthorship W2798850132A5051665033 @default.
- W2798850132 hasAuthorship W2798850132A5056273734 @default.
- W2798850132 hasAuthorship W2798850132A5082396421 @default.
- W2798850132 hasConcept C115961682 @default.
- W2798850132 hasConcept C119599485 @default.
- W2798850132 hasConcept C121332964 @default.
- W2798850132 hasConcept C127413603 @default.
- W2798850132 hasConcept C149635348 @default.
- W2798850132 hasConcept C154945302 @default.
- W2798850132 hasConcept C163258240 @default.
- W2798850132 hasConcept C165005293 @default.
- W2798850132 hasConcept C165801399 @default.
- W2798850132 hasConcept C172385210 @default.
- W2798850132 hasConcept C24326235 @default.
- W2798850132 hasConcept C2780077345 @default.
- W2798850132 hasConcept C41008148 @default.
- W2798850132 hasConcept C43214815 @default.
- W2798850132 hasConcept C46362747 @default.
- W2798850132 hasConcept C530198007 @default.
- W2798850132 hasConcept C62520636 @default.
- W2798850132 hasConcept C68043766 @default.
- W2798850132 hasConcept C6899612 @default.
- W2798850132 hasConcept C99498987 @default.
- W2798850132 hasConceptScore W2798850132C115961682 @default.
- W2798850132 hasConceptScore W2798850132C119599485 @default.
- W2798850132 hasConceptScore W2798850132C121332964 @default.
- W2798850132 hasConceptScore W2798850132C127413603 @default.
- W2798850132 hasConceptScore W2798850132C149635348 @default.
- W2798850132 hasConceptScore W2798850132C154945302 @default.
- W2798850132 hasConceptScore W2798850132C163258240 @default.
- W2798850132 hasConceptScore W2798850132C165005293 @default.
- W2798850132 hasConceptScore W2798850132C165801399 @default.
- W2798850132 hasConceptScore W2798850132C172385210 @default.
- W2798850132 hasConceptScore W2798850132C24326235 @default.
- W2798850132 hasConceptScore W2798850132C2780077345 @default.
- W2798850132 hasConceptScore W2798850132C41008148 @default.
- W2798850132 hasConceptScore W2798850132C43214815 @default.
- W2798850132 hasConceptScore W2798850132C46362747 @default.
- W2798850132 hasConceptScore W2798850132C530198007 @default.
- W2798850132 hasConceptScore W2798850132C62520636 @default.
- W2798850132 hasConceptScore W2798850132C68043766 @default.
- W2798850132 hasConceptScore W2798850132C6899612 @default.
- W2798850132 hasConceptScore W2798850132C99498987 @default.
- W2798850132 hasLocation W27988501321 @default.
- W2798850132 hasOpenAccess W2798850132 @default.
- W2798850132 hasPrimaryLocation W27988501321 @default.
- W2798850132 hasRelatedWork W1491404489 @default.
- W2798850132 hasRelatedWork W1985713288 @default.
- W2798850132 hasRelatedWork W2008171388 @default.
- W2798850132 hasRelatedWork W2032096459 @default.
- W2798850132 hasRelatedWork W2059194137 @default.
- W2798850132 hasRelatedWork W2118208413 @default.
- W2798850132 hasRelatedWork W2127798145 @default.
- W2798850132 hasRelatedWork W2168265936 @default.
- W2798850132 hasRelatedWork W2189166875 @default.
- W2798850132 hasRelatedWork W2294973495 @default.
- W2798850132 hasRelatedWork W2387361104 @default.
- W2798850132 hasRelatedWork W2508980427 @default.
- W2798850132 hasRelatedWork W2546663484 @default.
- W2798850132 hasRelatedWork W2900470714 @default.
- W2798850132 hasRelatedWork W2904084591 @default.
- W2798850132 hasRelatedWork W3139926566 @default.
- W2798850132 hasRelatedWork W3191703988 @default.
- W2798850132 hasRelatedWork W3193346974 @default.
- W2798850132 hasRelatedWork W2131870889 @default.
- W2798850132 hasRelatedWork W2185684287 @default.
- W2798850132 isParatext "false" @default.
- W2798850132 isRetracted "false" @default.
- W2798850132 magId "2798850132" @default.
- W2798850132 workType "article" @default.