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- W2799476140 abstract "A brief history of JEDEC qualification standards for Si-based technology is presented. JEDEC qualification standards have evolved over the years due to Si-technology process changes, better understanding of chip operating conditions, and improvements in our understanding of the reliability physics. One of the more significant evolutionary developments is how high temperature operation life (HTOL) testing is now viewed. HTOL testing, while it is necessary for device qualification, it is far from being sufficient. HTOL testing does not adequately address many of the important failure mechanisms for Si-ICs (EM, SM, TDDB, HCI, and BTI). For this reason, JEDEC standards in recent years have tended to focus more on reaching industry consensus on required reliability stress-structures, reliability stress-conditions, and reliability models. As for wide band gap (WBG) semiconductors, and the expectation of very high operating temperatures for power devices, reliability assurance for WBG devices is critically important. Reliability assurance for WBG devices will undoubtedly depend strongly on developing appropriate: reliability test structures, test conditions, and failure models." @default.
- W2799476140 created "2018-05-17" @default.
- W2799476140 creator A5046186735 @default.
- W2799476140 date "2018-03-01" @default.
- W2799476140 modified "2023-10-12" @default.
- W2799476140 title "Brief history of JEDEC qualification standards for silicon technology and their applicability(?) to WBG semiconductors" @default.
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- W2799476140 doi "https://doi.org/10.1109/irps.2018.8353556" @default.
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