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• W2801094737 abstract "Abstract Atom probe tomography has primarily been used for atomic scale characterization of high electrical conductivity materials. A high electrical field applied to needle-shaped specimens evaporates surface atoms, and a time of flight measurement determines each atom's identity. A 2-dimensional detector determines each atom's original position on the specimen. When repeated successively over many surface monolayers, the original specimen can be reconstructed into a 3-dimensional representation. In order to have an accurate 3-D reconstruction of the original, the field required for atomic evaporation must be known a-priori. For many metallic materials, this evaporation field is well characterized, and 3-D reconstructions can be achieved with reasonable accuracy." @default.
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• W2801094737 date "2008-07-01" @default.
• W2801094737 modified "2023-09-26" @default.
• W2801094737 title "Hardware and Techniques for Cross- Correlative TEM and Atom Probe Analysis" @default.
• W2801094737 cites W2019855812 @default.
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• W2801094737 doi "https://doi.org/10.1017/s1551929500059782" @default.
• W2801094737 hasPublicationYear "2008" @default.
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