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• W2801613836 abstract "High-resolution monochromated electron energy-loss spectroscopy has the potential to map vibrational modes at nanometer resolution. Using the SiO2/Si interface as a test case, we observe an initial drop in the SiO2 vibrational signal when the electron probe is 200 nm from the Si due to long-range nature of the Coulomb interaction. However, the distance from the interface at which the SiO2 integrated signal intensity drops to half its maximum value is 5 nm. We show that nanometer resolution is possible when selecting the SiO2/Si interface signal which is at a different energy position than the bulk signal. Calculations also show that, at 60 kV, the signal in the SiO2 can be treated non-relativistically (no retardation) while the signal in the Si, not surprisingly, is dominated by relativistic effects. For typical transmission electron microscope specimen thicknesses, surface coupling effects must also be considered." @default.
• W2801613836 created "2018-05-17" @default.
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• W2801613836 date "2018-02-01" @default.
• W2801613836 modified "2023-10-18" @default.
• W2801613836 title "The influence of surfaces and interfaces on high spatial resolution vibrational EELS from SiO2" @default.
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• W2801613836 doi "https://doi.org/10.1093/jmicro/dfy003" @default.
• W2801613836 hasPubMedId "https://pubmed.ncbi.nlm.nih.gov/29401291" @default.
• W2801613836 hasPublicationYear "2018" @default.
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