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• W2802576204 abstract "Due to statistical gate delays, the critical probability of a testable path varies among its test patterns. Thus, the delay defect coverage of a selected set of critical paths depends on the selected test set. A new framework to select a test set for improved delay defect coverage is presented. It uses an algorithm that computes the critical probability of a path by a test pattern and machine learning to identify a small test set that maximizes the combined delay defect coverage. Experimental results show a significant improvement in delay defect coverage over existing static critical path approach." @default.
• W2802576204 created "2018-05-17" @default.
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• W2802576204 date "2018-03-01" @default.
• W2802576204 modified "2023-09-27" @default.
• W2802576204 title "Test set identification for improved delay defect coverage in the presence of statistical delays" @default.
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• W2802576204 doi "https://doi.org/10.1109/isqed.2018.8357258" @default.
• W2802576204 hasPublicationYear "2018" @default.
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