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Matches in SemOpenAlex for { <https://semopenalex.org/work/W2807392004> ?p ?o ?g. }

• W2807392004 abstract "In this work, we give a direct interpretation of micrographs of the 60° and 90° defect core at the GaAs/Si interface using aberration corrected scanning transmission electron microscopy. We investigate the post-growth annealing effects on dislocation rearrangement at the interface as well as the threading dislocations in buffer layers; finally, the density of threading dislocations has been calculated as a function of annealing temperature." @default.
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• W2807392004 date "2018-06-06" @default.
• W2807392004 modified "2023-10-18" @default.
• W2807392004 title "Effect of rapid thermal annealing on threading dislocation density in III-V epilayers monolithically grown on silicon" @default.
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• W2807392004 doi "https://doi.org/10.1063/1.5011161" @default.
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