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- W2810347631 abstract "For the paper, we studied how bias stress interruption and reapplication influences threshold voltage ( V T ) drift results in SiC DMOSFETs during 175°C bias-temperature instability (BTI) tests. Bias interruptions of even short durations were found to result in significant loss of observed V T drift, although reapplying the stress bias for a short time immediately before making the post-stress measurement resulted in a significant recovery of the lost drift. The fractional V T drift (i.e., the ratio of “observed” to “actual” drift) was found to behave similarly to the case of 25°C bias stressing, with an apparent empirical relationship relating to the square of the reapply time, divided by interrupt time. Although questions of bias-stressing at high temperature with room-temperature measurement remain unresolved for now, these results continue to support the feasibility of stress bias reapplication to counteract the loss in V T drift due to delays or interruptions between stressing and measurement (which are a practical limitation imposed by the necessities of batch testing for qualification in a production environment)." @default.
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- W2810347631 date "2018-06-01" @default.
- W2810347631 modified "2023-10-03" @default.
- W2810347631 title "Influences of Bias Interruption and Reapplication on High-Temperature Threshold-Voltage Shifts of SiC DMOSFETs" @default.
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- W2810347631 doi "https://doi.org/10.4028/www.scientific.net/msf.924.743" @default.
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