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- W282641085 abstract "Abstract Some aspects of the growth of decorated stacking faults in a nickel base alloy are investigated by HVEM. The first stages of precipitation occur on perfect loops and that causes their dissociation into outer Frank and inner Shockley partials. Further expansion of Frank loops leads to two types of extrinsic decorated stacking faults: in the first type, the fault is covered with a thin homogeneous layer of precipitate and bounded by sessile dissociated Frank segments. On the other hand, the second type consists of small spherical precipitates spread on the faulted area; in this case, up-climb of the undis-sociated bounding Frank loop can occasionally be observed." @default.
- W282641085 created "2016-06-24" @default.
- W282641085 creator A5028131756 @default.
- W282641085 date "1976-04-01" @default.
- W282641085 modified "2023-09-26" @default.
- W282641085 title "Étude par microscopie électronique à très haute tension du processus de croissance des défauts d'empilement décorés dans un superalliage à base nickel" @default.
- W282641085 cites W2016133657 @default.
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- W282641085 doi "https://doi.org/10.1016/0026-0800(76)90011-2" @default.
- W282641085 hasPublicationYear "1976" @default.
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