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- W28574857 abstract "Abstract : The study of defects in III-V and ZnO semiconductors was accomplished using ultrasoft pseudopotential (USPP) method. For that, a numerical approach was also implemented to calculate isotropic hyperfine-parameters for isolated defects based on a supercell method." @default.
- W28574857 created "2016-06-24" @default.
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- W28574857 date "2006-03-01" @default.
- W28574857 modified "2023-09-27" @default.
- W28574857 title "Theoretical Study of Defect Signatures in III-V and II-VI Semiconductors" @default.
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