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• W2883157281 abstract "High-spatial-resolution imaging of an insulating LaAlO3 film is performed with non-contact atomic force microscopy. The LaAlO3 film was grown homogeneously on a LaAlO3 substrate using pulsed laser deposition, and it was imaged without breaking the vacuum. The sample preparation method for obtaining atomically flat surfaces suitable for atomic resolution imaging is presented. The LaAlO3 surface shows a reconstruction with a (1 × 4) structure, which is consistent with low-energy electron diffraction results. We believe that the method presented in this manuscript is an important advancement in the fabrication of insulating thin films used for atomic-level devices." @default.
• W2883157281 created "2018-08-03" @default.
• W2883157281 creator A5056330281 @default.
• W2883157281 creator A5091698608 @default.
• W2883157281 date "2018-07-16" @default.
• W2883157281 modified "2023-10-16" @default.
• W2883157281 title "High-resolution imaging of LaAlO₃(100)–(1 × 4) reconstructed surface using non-contact atomic force microscopy" @default.
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• W2883157281 doi "https://doi.org/10.1063/1.5037741" @default.
• W2883157281 hasPublicationYear "2018" @default.
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