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• W2885101768 abstract "Phase retrieval is an important tool to unveil wavefront of light, especially in high performance microscopy such as Fourier ptychographic microscopy (FPM). In general phase-retrieval methods, the resolution and the number of measurements are in a trade-off relationship. Inspired by FPM, we devise what we believe is a novel microscopic phase-retrieval method, termed single-shot FPM (SSFPM). In our approach, the imaging performance exceeds the trade-off relationship in that it enables phase retrieval for high resolution with a single measurement. By placing the lens array at the Fourier plane of the objective lens, multiple intensity profiles required for the FPM algorithm are collected in a single shot. To achieve enough redundancy of data for satisfying convergence condition of FPM, the specimen is simultaneously illuminated by multiple light-emitting diodes. SSFPM reconstructs quantitative phase profile and enhances the resolution sacrificed by applying lens-array imaging. We demonstrate the performance of SSFPM with numerical simulation and experiments. The prototype achieves lateral resolution of 3.10 μm over a field of view of 0.34  mm2. Without an interferometer or scanning devices, SSFPM can reconstruct high resolution of a complex profile with a single shot." @default.
• W2885101768 created "2018-08-22" @default.
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• W2885101768 date "2018-08-08" @default.
• W2885101768 modified "2023-10-16" @default.
• W2885101768 title "Single-shot phase retrieval via Fourier ptychographic microscopy" @default.
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• W2885101768 doi "https://doi.org/10.1364/optica.5.000976" @default.
• W2885101768 hasPublicationYear "2018" @default.
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