Matches in SemOpenAlex for { <https://semopenalex.org/work/W2888048319> ?p ?o ?g. }
- W2888048319 abstract "The advanced properties of modern materials originate from their nanoscale size and shape and from chemical modifications or doping. Special techniques that can measure the chemical state in the nanoscale are required for exploration and understanding the properties of these materials. While X‐ray photoelectron spectroscopy (XPS) can access the necessary chemical information, conventional setups have no spatial resolution. The scanning photoelectron microscope (SPEM) takes in advent the third generation synchrotron radiation facilities and uses a zone plate (ZP) focusing optics that allows spatially resolved XPS measurements in the submicron scale. Several recent examples of investigations of chemically modified or doped nanomaterials are given. The modification of suspended and supported graphene with nitrogen and fluorine is presented as well as the doping dependent position of the Fermi‐level in single GsAs nanowires and the Mott–Hubbard transition in Cr‐doped vanadium oxide. These examples show several peculiar SPEM abilities like a high surface and chemical sensitivity and a submicron spatial resolution proving the capability and importance of this technique to study materials at the nanoscale." @default.
- W2888048319 created "2018-08-31" @default.
- W2888048319 creator A5004148659 @default.
- W2888048319 creator A5008328178 @default.
- W2888048319 creator A5013748658 @default.
- W2888048319 creator A5015170317 @default.
- W2888048319 creator A5023670300 @default.
- W2888048319 creator A5033054832 @default.
- W2888048319 creator A5035250860 @default.
- W2888048319 creator A5039105398 @default.
- W2888048319 creator A5043537994 @default.
- W2888048319 creator A5056223374 @default.
- W2888048319 creator A5059239268 @default.
- W2888048319 creator A5072282719 @default.
- W2888048319 creator A5079614427 @default.
- W2888048319 creator A5089038012 @default.
- W2888048319 date "2018-08-21" @default.
- W2888048319 modified "2023-10-16" @default.
- W2888048319 title "Scanning Photoelectron Spectro-Microscopy: A Modern Tool for the Study of Materials at the Nanoscale" @default.
- W2888048319 cites W1175011262 @default.
- W2888048319 cites W1464461672 @default.
- W2888048319 cites W1964347355 @default.
- W2888048319 cites W1974927760 @default.
- W2888048319 cites W1990670601 @default.
- W2888048319 cites W1998779803 @default.
- W2888048319 cites W2000181749 @default.
- W2888048319 cites W2003130482 @default.
- W2888048319 cites W2003171683 @default.
- W2888048319 cites W2009376694 @default.
- W2888048319 cites W2010756407 @default.
- W2888048319 cites W2025956366 @default.
- W2888048319 cites W2027011592 @default.
- W2888048319 cites W2038726293 @default.
- W2888048319 cites W2039153024 @default.
- W2888048319 cites W2051569956 @default.
- W2888048319 cites W2052565695 @default.
- W2888048319 cites W2067732597 @default.
- W2888048319 cites W2102101242 @default.
- W2888048319 cites W2157202716 @default.
- W2888048319 cites W2166691312 @default.
- W2888048319 cites W2168280682 @default.
- W2888048319 cites W2229411512 @default.
- W2888048319 cites W2234325859 @default.
- W2888048319 cites W2325644008 @default.
- W2888048319 cites W2508903045 @default.
- W2888048319 cites W2519443265 @default.
- W2888048319 cites W2607032700 @default.
- W2888048319 cites W2609933129 @default.
- W2888048319 cites W2621288577 @default.
- W2888048319 cites W2621439373 @default.
- W2888048319 cites W2625708684 @default.
- W2888048319 cites W2705610165 @default.
- W2888048319 cites W2727467343 @default.
- W2888048319 cites W2766118576 @default.
- W2888048319 cites W2768499195 @default.
- W2888048319 cites W1994918237 @default.
- W2888048319 doi "https://doi.org/10.1002/pssa.201800308" @default.
- W2888048319 hasPublicationYear "2018" @default.
- W2888048319 type Work @default.
- W2888048319 sameAs 2888048319 @default.
- W2888048319 citedByCount "14" @default.
- W2888048319 countsByYear W28880483192019 @default.
- W2888048319 countsByYear W28880483192020 @default.
- W2888048319 countsByYear W28880483192021 @default.
- W2888048319 countsByYear W28880483192022 @default.
- W2888048319 countsByYear W28880483192023 @default.
- W2888048319 crossrefType "journal-article" @default.
- W2888048319 hasAuthorship W2888048319A5004148659 @default.
- W2888048319 hasAuthorship W2888048319A5008328178 @default.
- W2888048319 hasAuthorship W2888048319A5013748658 @default.
- W2888048319 hasAuthorship W2888048319A5015170317 @default.
- W2888048319 hasAuthorship W2888048319A5023670300 @default.
- W2888048319 hasAuthorship W2888048319A5033054832 @default.
- W2888048319 hasAuthorship W2888048319A5035250860 @default.
- W2888048319 hasAuthorship W2888048319A5039105398 @default.
- W2888048319 hasAuthorship W2888048319A5043537994 @default.
- W2888048319 hasAuthorship W2888048319A5056223374 @default.
- W2888048319 hasAuthorship W2888048319A5059239268 @default.
- W2888048319 hasAuthorship W2888048319A5072282719 @default.
- W2888048319 hasAuthorship W2888048319A5079614427 @default.
- W2888048319 hasAuthorship W2888048319A5089038012 @default.
- W2888048319 hasConcept C102404424 @default.
- W2888048319 hasConcept C120665830 @default.
- W2888048319 hasConcept C121332964 @default.
- W2888048319 hasConcept C127413603 @default.
- W2888048319 hasConcept C138631740 @default.
- W2888048319 hasConcept C154945302 @default.
- W2888048319 hasConcept C159078339 @default.
- W2888048319 hasConcept C16332341 @default.
- W2888048319 hasConcept C171250308 @default.
- W2888048319 hasConcept C175708663 @default.
- W2888048319 hasConcept C192562407 @default.
- W2888048319 hasConcept C2780841128 @default.
- W2888048319 hasConcept C41008148 @default.
- W2888048319 hasConcept C42360764 @default.
- W2888048319 hasConcept C45206210 @default.
- W2888048319 hasConcept C49040817 @default.
- W2888048319 hasConcept C57863236 @default.
- W2888048319 hasConcept C65597285 @default.
- W2888048319 hasConcept C74214498 @default.