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• W2888454976 endingPage "041008" @default.
• W2888454976 startingPage "041008" @default.
• W2888454976 abstract "Ripples and impurity atoms are universally present in 2D materials, limiting carrier mobility, creating pseudo–magnetic fields, or affecting the electronic and magnetic properties. Scanning transmission electron microscopy (STEM) generally provides picometer-level precision in the determination of the location of atoms or atomic 'columns' in the in-image plane (xy plane). However, precise atomic positions in the z-direction as well as the presence of certain impurities are difficult to detect. Furthermore, images containing moiré patterns such as those in angle-mismatched bilayer graphene compound the problem by limiting the determination of atomic positions in the xy plane. Here, we introduce a reconstructive approach for the analysis of STEM images of twisted bilayers that combines the accessible xy coordinates of atomic positions in a STEM image with density-functional-theory calculations. The approach allows us to determine all three coordinates of all atomic positions in the bilayer and establishes the presence and identity of impurities. The deduced strain-induced rippling in a twisted bilayer graphene sample is consistent with the continuum model of elasticity. We also find that the moiré pattern induces undulations in the z direction that are approximately an order of magnitude smaller than the strain-induced rippling. A single substitutional impurity, identified as nitrogen, is detected. The present reconstructive approach can, therefore, distinguish between moiré and strain-induced effects and allows for the full reconstruction of 3D positions and atomic identities." @default.
• W2888454976 created "2018-08-31" @default.
• W2888454976 creator A5031020271 @default.
• W2888454976 creator A5044699630 @default.
• W2888454976 creator A5048552375 @default.
• W2888454976 creator A5055101281 @default.
• W2888454976 creator A5064538774 @default.
• W2888454976 creator A5074671329 @default.
• W2888454976 creator A5077906043 @default.
• W2888454976 creator A5082482869 @default.
• W2888454976 creator A5084949021 @default.
• W2888454976 creator A5085233892 @default.
• W2888454976 creator A5085934100 @default.
• W2888454976 date "2018-09-07" @default.
• W2888454976 modified "2023-10-16" @default.
• W2888454976 title "Theory-assisted determination of nano-rippling and impurities in atomic resolution images of angle-mismatched bilayer graphene" @default.
• W2888454976 cites W1635273272 @default.
• W2888454976 cites W1964117058 @default.
• W2888454976 cites W1970127494 @default.
• W2888454976 cites W1977294157 @default.
• W2888454976 cites W1979544533 @default.
• W2888454976 cites W1981368803 @default.
• W2888454976 cites W1989506279 @default.
• W2888454976 cites W1999820475 @default.
• W2888454976 cites W2005400106 @default.
• W2888454976 cites W2027179520 @default.
• W2888454976 cites W2028117546 @default.
• W2888454976 cites W2038792524 @default.
• W2888454976 cites W2056715156 @default.
• W2888454976 cites W2069521837 @default.
• W2888454976 cites W2079597168 @default.
• W2888454976 cites W2083222334 @default.
• W2888454976 cites W2084366961 @default.
• W2888454976 cites W2084413241 @default.
• W2888454976 cites W2090415453 @default.
• W2888454976 cites W2092157292 @default.
• W2888454976 cites W2107901140 @default.
• W2888454976 cites W2113467957 @default.
• W2888454976 cites W2117653928 @default.
• W2888454976 cites W2118621333 @default.
• W2888454976 cites W2119461470 @default.
• W2888454976 cites W2127169435 @default.
• W2888454976 cites W2128934324 @default.
• W2888454976 cites W2133155955 @default.
• W2888454976 cites W2134255512 @default.
• W2888454976 cites W2134677038 @default.
• W2888454976 cites W2139104163 @default.
• W2888454976 cites W2144237170 @default.
• W2888454976 cites W2159651170 @default.
• W2888454976 cites W2192529148 @default.
• W2888454976 cites W2278966914 @default.
• W2888454976 cites W2555536042 @default.
• W2888454976 cites W2604538119 @default.
• W2888454976 cites W2787584289 @default.
• W2888454976 cites W2793077529 @default.
• W2888454976 cites W2793369479 @default.
• W2888454976 cites W3105458900 @default.
• W2888454976 cites W3141201028 @default.
• W2888454976 doi "https://doi.org/10.1088/2053-1583/aadb5f" @default.
• W2888454976 hasPublicationYear "2018" @default.
• W2888454976 type Work @default.
• W2888454976 sameAs 2888454976 @default.
• W2888454976 citedByCount "5" @default.
• W2888454976 countsByYear W28884549762019 @default.
• W2888454976 countsByYear W28884549762020 @default.
• W2888454976 countsByYear W28884549762021 @default.
• W2888454976 countsByYear W28884549762023 @default.
• W2888454976 crossrefType "journal-article" @default.
• W2888454976 hasAuthorship W2888454976A5031020271 @default.
• W2888454976 hasAuthorship W2888454976A5044699630 @default.
• W2888454976 hasAuthorship W2888454976A5048552375 @default.
• W2888454976 hasAuthorship W2888454976A5055101281 @default.
• W2888454976 hasAuthorship W2888454976A5064538774 @default.
• W2888454976 hasAuthorship W2888454976A5074671329 @default.
• W2888454976 hasAuthorship W2888454976A5077906043 @default.
• W2888454976 hasAuthorship W2888454976A5082482869 @default.
• W2888454976 hasAuthorship W2888454976A5084949021 @default.
• W2888454976 hasAuthorship W2888454976A5085233892 @default.
• W2888454976 hasAuthorship W2888454976A5085934100 @default.
• W2888454976 hasBestOaLocation W28884549762 @default.
• W2888454976 hasConcept C121332964 @default.
• W2888454976 hasConcept C143401881 @default.
• W2888454976 hasConcept C146088050 @default.
• W2888454976 hasConcept C171250308 @default.
• W2888454976 hasConcept C185592680 @default.
• W2888454976 hasConcept C192157962 @default.
• W2888454976 hasConcept C192562407 @default.
• W2888454976 hasConcept C193016168 @default.
• W2888454976 hasConcept C26873012 @default.
• W2888454976 hasConcept C30080830 @default.
• W2888454976 hasConcept C41625074 @default.
• W2888454976 hasConcept C41999313 @default.
• W2888454976 hasConcept C55493867 @default.
• W2888454976 hasConcept C62520636 @default.
• W2888454976 hasConcept C71987851 @default.
• W2888454976 hasConceptScore W2888454976C121332964 @default.
• W2888454976 hasConceptScore W2888454976C143401881 @default.
• W2888454976 hasConceptScore W2888454976C146088050 @default.

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