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- W2892052002 abstract "Improving energy efficiency of the memory subsystem becomes increasingly important for all digital systems due to the rapid growth of data. Many recent schemes have attempted to reduce the DRAM power by relaxing the refresh rate, which may negatively affect the DRAM reliability. To optimize the trade-offs between power and reliability, existing studies rely on experimental setups based on FPGAs and the use of few known data-patterns for exciting rare worst-case circuit reliability effects. However, by doing so, existing studies may be missing to capture the real DRAM behavior within a commodity server with a fully fledged OS." @default.
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- W2892052002 date "2018-07-15" @default.
- W2892052002 modified "2023-10-16" @default.
- W2892052002 title "Characterization of HPC workloads on an ARMv8 based server under relaxed DRAM refresh and thermal stress" @default.
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- W2892052002 doi "https://doi.org/10.1145/3229631.3236091" @default.
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