FRINK Linked Data Fragments server

Matches in SemOpenAlex for { <https://semopenalex.org/work/W2893082898> ?p ?o ?g. }

• W2893082898 endingPage "626" @default.
• W2893082898 startingPage "620" @default.
• W2893082898 abstract "We present an extensive analysis of the degradation of GaN-on-GaN fin-vertical transistors submitted to stress under positive gate voltage and off-state conditions. By analysing the degradation kinetics we demonstrate the existence of different processes: (i) trapping of electrons in the gate insulator under positive gate bias, (ii) time-dependent breakdown of the gate MOS structure under forward gate voltage; (iii) catastrophic failure for off-state voltages higher than 280 V. 2D simulations are used to identify the physical location of the failed region, and to investigate the dependence of electric field on fin width (values between 70 nm, 195 nm and 280 nm)." @default.
• W2893082898 created "2018-10-05" @default.
• W2893082898 creator A5002653396 @default.
• W2893082898 creator A5024027903 @default.
• W2893082898 creator A5027748782 @default.
• W2893082898 creator A5037893752 @default.
• W2893082898 creator A5059611177 @default.
• W2893082898 creator A5064109540 @default.
• W2893082898 creator A5079053768 @default.
• W2893082898 date "2018-09-01" @default.
• W2893082898 modified "2023-09-27" @default.
• W2893082898 title "Degradation of vertical GaN-on-GaN fin transistors: Step-stress and constant voltage experiments" @default.
• W2893082898 cites W1979877963 @default.
• W2893082898 cites W2005367356 @default.
• W2893082898 cites W2042313982 @default.
• W2893082898 cites W2069950657 @default.
• W2893082898 cites W2588456444 @default.
• W2893082898 cites W2726235191 @default.
• W2893082898 cites W2788013722 @default.
• W2893082898 doi "https://doi.org/10.1016/j.microrel.2018.06.044" @default.
• W2893082898 hasPublicationYear "2018" @default.
• W2893082898 type Work @default.
• W2893082898 sameAs 2893082898 @default.
• W2893082898 citedByCount "5" @default.
• W2893082898 countsByYear W28930828982020 @default.
• W2893082898 countsByYear W28930828982021 @default.
• W2893082898 countsByYear W28930828982022 @default.
• W2893082898 crossrefType "journal-article" @default.
• W2893082898 hasAuthorship W2893082898A5002653396 @default.
• W2893082898 hasAuthorship W2893082898A5024027903 @default.
• W2893082898 hasAuthorship W2893082898A5027748782 @default.
• W2893082898 hasAuthorship W2893082898A5037893752 @default.
• W2893082898 hasAuthorship W2893082898A5059611177 @default.
• W2893082898 hasAuthorship W2893082898A5064109540 @default.
• W2893082898 hasAuthorship W2893082898A5079053768 @default.
• W2893082898 hasBestOaLocation W28930828981 @default.
• W2893082898 hasConcept C119321828 @default.
• W2893082898 hasConcept C119599485 @default.
• W2893082898 hasConcept C121332964 @default.
• W2893082898 hasConcept C127413603 @default.
• W2893082898 hasConcept C138885662 @default.
• W2893082898 hasConcept C159985019 @default.
• W2893082898 hasConcept C165801399 @default.
• W2893082898 hasConcept C172385210 @default.
• W2893082898 hasConcept C18903297 @default.
• W2893082898 hasConcept C192562407 @default.
• W2893082898 hasConcept C195370968 @default.
• W2893082898 hasConcept C21036866 @default.
• W2893082898 hasConcept C2777924906 @default.
• W2893082898 hasConcept C2779679103 @default.
• W2893082898 hasConcept C2984119601 @default.
• W2893082898 hasConcept C41895202 @default.
• W2893082898 hasConcept C49040817 @default.
• W2893082898 hasConcept C53143962 @default.
• W2893082898 hasConcept C544956773 @default.
• W2893082898 hasConcept C60799052 @default.
• W2893082898 hasConcept C62520636 @default.
• W2893082898 hasConcept C86803240 @default.
• W2893082898 hasConcept C91721477 @default.
• W2893082898 hasConceptScore W2893082898C119321828 @default.
• W2893082898 hasConceptScore W2893082898C119599485 @default.
• W2893082898 hasConceptScore W2893082898C121332964 @default.
• W2893082898 hasConceptScore W2893082898C127413603 @default.
• W2893082898 hasConceptScore W2893082898C138885662 @default.
• W2893082898 hasConceptScore W2893082898C159985019 @default.
• W2893082898 hasConceptScore W2893082898C165801399 @default.
• W2893082898 hasConceptScore W2893082898C172385210 @default.
• W2893082898 hasConceptScore W2893082898C18903297 @default.
• W2893082898 hasConceptScore W2893082898C192562407 @default.
• W2893082898 hasConceptScore W2893082898C195370968 @default.
• W2893082898 hasConceptScore W2893082898C21036866 @default.
• W2893082898 hasConceptScore W2893082898C2777924906 @default.
• W2893082898 hasConceptScore W2893082898C2779679103 @default.
• W2893082898 hasConceptScore W2893082898C2984119601 @default.
• W2893082898 hasConceptScore W2893082898C41895202 @default.
• W2893082898 hasConceptScore W2893082898C49040817 @default.
• W2893082898 hasConceptScore W2893082898C53143962 @default.
• W2893082898 hasConceptScore W2893082898C544956773 @default.
• W2893082898 hasConceptScore W2893082898C60799052 @default.
• W2893082898 hasConceptScore W2893082898C62520636 @default.
• W2893082898 hasConceptScore W2893082898C86803240 @default.
• W2893082898 hasConceptScore W2893082898C91721477 @default.
• W2893082898 hasFunder F4320321966 @default.
• W2893082898 hasLocation W28930828981 @default.
• W2893082898 hasLocation W28930828982 @default.
• W2893082898 hasOpenAccess W2893082898 @default.
• W2893082898 hasPrimaryLocation W28930828981 @default.
• W2893082898 hasRelatedWork W1532486559 @default.
• W2893082898 hasRelatedWork W1943747550 @default.
• W2893082898 hasRelatedWork W2027381561 @default.
• W2893082898 hasRelatedWork W2037014682 @default.
• W2893082898 hasRelatedWork W2105180128 @default.
• W2893082898 hasRelatedWork W2139465209 @default.
• W2893082898 hasRelatedWork W2467246581 @default.
• W2893082898 hasRelatedWork W2968867140 @default.
• W2893082898 hasRelatedWork W2987375413 @default.
• W2893082898 hasRelatedWork W3100885724 @default.
• W2893082898 hasVolume "88-90" @default.

• next