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- W2893924466 abstract "Abstract The microstructure, composition, semiconductive properties and electrochemical performance of passive film formed on the surface of Ti-6Al-4 V alloy produced by electron beam melting (Abbreviated as ET) were compared with conventional wrought counterpart (WT) in phosphate buffered saline at 37 °C. The results demonstrated a thinner and more compact passive film formed on ET, which was attributed to the small grain size and high density of grain boundaries in ET, these active sites increased the growth rate at the initial stage in the manner of 3D progressive nucleation mechanism of passive film, leading to superior corrosion resistance than WT." @default.
- W2893924466 created "2018-10-05" @default.
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- W2893924466 date "2018-12-01" @default.
- W2893924466 modified "2023-10-14" @default.
- W2893924466 title "Electrochemical behaviour of passive film formed on the surface of Ti-6Al-4V alloys fabricated by electron beam melting" @default.
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- W2893924466 doi "https://doi.org/10.1016/j.corsci.2018.09.010" @default.
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