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• W2894935531 endingPage "591" @default.
• W2894935531 startingPage "583" @default.
• W2894935531 abstract "This paper presents a new attempt to further understand negative bias temperature instability (NBTI) stress in semiconductor devices. NBTI impact has been experimentally investigated on both p-substrate MOS (nMOS-capacitor) and nMOS transistors under accumulation condition, and new findings have been revealed. Indeed, nMOS-capacitor's flat band shift (ΔV <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>FB</sub> ) under NBTI stress has disclosed that time exponent (n) and activation energy (E <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>a</sub> ) do vary with applied voltage stress pointing out to the contribution of two components, interface (N <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>IT</sub> ) and oxide (N <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>OT</sub> ) traps. Besides, the threshold electric field delimiting NBTI and stress induced leakage current can be well established. These findings have been confirmed by the appearance of a turn-around effect in nMOS transistors under NBTI stress. Moreover, charge pumping characterization has unveiled that NBTI degradation in nMOS transistor goes through two stages. First, only NIT is created, then simultaneous generation of N <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>IT</sub> and N <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>OT</sub> takes part." @default.
• W2894935531 created "2018-10-12" @default.
• W2894935531 creator A5044013044 @default.
• W2894935531 creator A5047214860 @default.
• W2894935531 creator A5070292814 @default.
• W2894935531 creator A5071929916 @default.
• W2894935531 creator A5074744330 @default.
• W2894935531 date "2018-12-01" @default.
• W2894935531 modified "2023-09-25" @default.
• W2894935531 title "Analysis of NBTI Degradation in nMOS-Capacitors and nMOSFETs" @default.
• W2894935531 cites W1605768493 @default.
• W2894935531 cites W1974786744 @default.
• W2894935531 cites W1980402712 @default.
• W2894935531 cites W1981996306 @default.
• W2894935531 cites W1991837639 @default.
• W2894935531 cites W1991891926 @default.
• W2894935531 cites W1999919743 @default.
• W2894935531 cites W2010310741 @default.
• W2894935531 cites W2021322488 @default.
• W2894935531 cites W2030275640 @default.
• W2894935531 cites W2034985113 @default.
• W2894935531 cites W2053030666 @default.
• W2894935531 cites W2056630034 @default.
• W2894935531 cites W2058303251 @default.
• W2894935531 cites W2067583253 @default.
• W2894935531 cites W2069452468 @default.
• W2894935531 cites W2070047877 @default.
• W2894935531 cites W2081595597 @default.
• W2894935531 cites W2086009252 @default.
• W2894935531 cites W2093029609 @default.
• W2894935531 cites W2099724046 @default.
• W2894935531 cites W2104166866 @default.
• W2894935531 cites W2107300516 @default.
• W2894935531 cites W2111013026 @default.
• W2894935531 cites W2113631194 @default.
• W2894935531 cites W2126005942 @default.
• W2894935531 cites W2134085389 @default.
• W2894935531 cites W2134129730 @default.
• W2894935531 cites W2134777311 @default.
• W2894935531 cites W2136376683 @default.
• W2894935531 cites W2138787284 @default.
• W2894935531 cites W2140390681 @default.
• W2894935531 cites W2140761344 @default.
• W2894935531 cites W2156864581 @default.
• W2894935531 cites W2167021379 @default.
• W2894935531 cites W2167926015 @default.
• W2894935531 cites W2171853149 @default.
• W2894935531 cites W2255400686 @default.
• W2894935531 cites W2289365957 @default.
• W2894935531 cites W2344257534 @default.
• W2894935531 cites W2527586943 @default.
• W2894935531 cites W2539733186 @default.
• W2894935531 cites W2540699116 @default.
• W2894935531 cites W2542558641 @default.
• W2894935531 cites W2543188300 @default.
• W2894935531 cites W2591640162 @default.
• W2894935531 cites W2621126165 @default.
• W2894935531 cites W2625398037 @default.
• W2894935531 cites W2773913008 @default.
• W2894935531 cites W2781758939 @default.
• W2894935531 cites W2781768675 @default.
• W2894935531 cites W2784109122 @default.
• W2894935531 cites W2790890920 @default.
• W2894935531 doi "https://doi.org/10.1109/tdmr.2018.2874359" @default.
• W2894935531 hasPublicationYear "2018" @default.
• W2894935531 type Work @default.
• W2894935531 sameAs 2894935531 @default.
• W2894935531 citedByCount "6" @default.
• W2894935531 countsByYear W28949355312020 @default.
• W2894935531 countsByYear W28949355312021 @default.
• W2894935531 countsByYear W28949355312022 @default.
• W2894935531 countsByYear W28949355312023 @default.
• W2894935531 crossrefType "journal-article" @default.
• W2894935531 hasAuthorship W2894935531A5044013044 @default.
• W2894935531 hasAuthorship W2894935531A5047214860 @default.
• W2894935531 hasAuthorship W2894935531A5070292814 @default.
• W2894935531 hasAuthorship W2894935531A5071929916 @default.
• W2894935531 hasAuthorship W2894935531A5074744330 @default.
• W2894935531 hasConcept C119599485 @default.
• W2894935531 hasConcept C121332964 @default.
• W2894935531 hasConcept C127413603 @default.
• W2894935531 hasConcept C138885662 @default.
• W2894935531 hasConcept C165801399 @default.
• W2894935531 hasConcept C172385210 @default.
• W2894935531 hasConcept C184720557 @default.
• W2894935531 hasConcept C192562407 @default.
• W2894935531 hasConcept C195370968 @default.
• W2894935531 hasConcept C197162436 @default.
• W2894935531 hasConcept C21036866 @default.
• W2894935531 hasConcept C41895202 @default.
• W2894935531 hasConcept C49040817 @default.
• W2894935531 hasConcept C52192207 @default.
• W2894935531 hasConcept C557185 @default.
• W2894935531 hasConceptScore W2894935531C119599485 @default.
• W2894935531 hasConceptScore W2894935531C121332964 @default.
• W2894935531 hasConceptScore W2894935531C127413603 @default.
• W2894935531 hasConceptScore W2894935531C138885662 @default.
• W2894935531 hasConceptScore W2894935531C165801399 @default.

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