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- W2895976516 abstract "In scanning tunneling microscopy, we witness in recent years a paradigm shift from “just imaging” to detailed spectroscopic measurements at the nanoscale and multi-tip scanning tunneling microscope (STM) is a technique following this trend. It is capable of performing nanoscale charge transport measurements like a “multimeter at the nanoscale.” Distance-dependent four-point measurements, the acquisition of nanoscale potential maps at current carrying nanostructures and surfaces, as well as the acquisition of I − V curves of nanoelectronic devices are examples of the capabilities of the multi-tip STM technique. In this review, we focus on two aspects: How to perform the multi-tip STM measurements and how to analyze the acquired data in order to gain insight into nanoscale charge transport processes for a variety of samples. We further discuss specifics of the electronics for multi-tip STM and the properties of tips for multi-tip STM, and present methods for a tip approach to nanostructures on insulating substrates. We introduce methods on how to extract the conductivity/resistivity for mixed 2D/3D systems from four-point measurements, how to measure the conductivity of 2D sheets, and how to introduce scanning tunneling potentiometry measurements with a multi-tip setup. For the example of multi-tip measurements at freestanding vapor liquid solid grown nanowires, we discuss contact resistances as well as the influence of the presence of the probing tips on the four point measurements." @default.
- W2895976516 created "2018-10-26" @default.
- W2895976516 creator A5006711166 @default.
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- W2895976516 date "2018-10-01" @default.
- W2895976516 modified "2023-09-25" @default.
- W2895976516 title "Invited Review Article: Multi-tip scanning tunneling microscopy: Experimental techniques and data analysis" @default.
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- W2895976516 doi "https://doi.org/10.1063/1.5042346" @default.
- W2895976516 hasPubMedId "https://pubmed.ncbi.nlm.nih.gov/30399776" @default.
- W2895976516 hasPublicationYear "2018" @default.
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