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- W289639087 abstract "In this chapter a specific transmission electron microscopy (TEM) technique, called off-axis electron holography, is described. As for any TEM technique the sample needs to be sufficiently thin to allow electrons to traverse the specimen. First I will introduce the technique, and describe the basic concepts and the type of signals that can be measured by holography. A comparison between 2D samples and nanowires (NWs) is presented to show challenges and solutions for both types of samples and the necessary sample preparation. After a review of literature on holography of NWs and particles, I will show results where holography was used to study dopant characterization in modulation-doped silicon NWs, and characterization of electric fields in GaN–AlN NW heterostructures. More examples of applications of electron holography on NWs will be presented in the next chapter. The idea of the present chapter is to give a flavor of what holography is and can do with a minimum of equations, and also to describe the challenges that we face to get quantitative information on NWs by electron holography. At the end of the chapter you will find a conclusion and perspectives and further suggested reading material on holography." @default.
- W289639087 created "2016-06-24" @default.
- W289639087 creator A5017249686 @default.
- W289639087 date "2015-01-01" @default.
- W289639087 modified "2023-10-13" @default.
- W289639087 title "Electron holography of nanowires – Part 2" @default.
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- W289639087 doi "https://doi.org/10.1016/b978-1-78242-253-2.00009-8" @default.
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