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- W2896444845 abstract "Voltage measurement setups for impulse current tests have to deal with the unintended coupling of magnetic fields into the test probes. As a result induced voltages can lead to a misinterpretation of the measured voltage curve which is essential for the whole development process of components like surge protective devices (SPD). To investigate the influence of the magnetic coupling a test setup, consisting of a surge current generator and a conductor arrangement representing the device under test (DUT), is implemented. A printed circuit board (PCB) with different conductor loops specifically designed for the investigation is used as a probe to measure the voltage drop across the conductor. Additionally, the conductor loops provide a well-defined coupling behaviour. The area which is permeated by the magnetic flux can be adjusted in order to evaluate the influence of the conductor loop-area on the induced voltage. Furthermore, the injected impulse current is varied to analyse the effect of the respective current value on the parasitic coupling in the measurement setup. For a deeper understanding of the magnetic coupling behaviour a field simulation of the test setup is carried out. The parametrised simulation model is validated by the respective measurements. In further studies the obtained results could be used for a more exact determination of the voltage drop solely across the DUT due to the fact that the parasitic induced voltages can be considered separately in the simulation process." @default.
- W2896444845 created "2018-10-26" @default.
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- W2896444845 date "2018-08-01" @default.
- W2896444845 modified "2023-10-16" @default.
- W2896444845 title "Parasitic Magnetic Coupling in Voltage Measurement Setups for Impulse Current Tests" @default.
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- W2896444845 doi "https://doi.org/10.1109/emceurope.2018.8485117" @default.
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