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- W2896840980 abstract "The process of damage accumulation in thin ruthenium films exposed to multiple femtosecond extreme ultraviolet (XUV) free-electron laser (FEL) pulses below the critical angle of reflectance at the FEL facility in Hamburg (FLASH) was experimentally analyzed. The multi-shot damage threshold is found to be lower than the single-shot damage threshold. Detailed analysis of the damage morphology and its dependence on irradiation conditions justifies the assumption that cavitation induced by the FEL pulse is the prime mechanism responsible for multi-shot damage in optical coatings." @default.
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- W2896840980 date "2018-10-16" @default.
- W2896840980 modified "2023-10-10" @default.
- W2896840980 title "Damage accumulation in thin ruthenium films induced by repetitive exposure to femtosecond XUV pulses below the single-shot ablation threshold" @default.
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- W2896840980 doi "https://doi.org/10.1364/josab.35.002799" @default.
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