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• W2897046351 abstract "Copper nanolayers were formed using the vacuum magnetron-assisted sputtering (direct current) in various technological modes (sedimentation speed, working pressure, discharge power). Results of microstructural study of the 1 nm to 65 nm thick copper nanofilms deposited on quartz, glass and silicon substrates are presented. Spectra of transmission and reflection coefficients of the copper nanofilms were studied in the wavelength range from $0.2 mutext{m}$ to $1.1 mutext{m}$ , The transmission and reflection spectra of films correspond well to the known spectra of bulk materials. The obtained results are of practical importance for development of nanostructural systems with the preset optical properties and for design of functional devices to be used in optoelectronics, information and energy-saving technologies." @default.
• W2897046351 created "2018-10-26" @default.
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• W2897046351 date "2018-04-01" @default.
• W2897046351 modified "2023-09-30" @default.
• W2897046351 title "Investigation of the Structure and Optical Properties of Thin Copper Films" @default.
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• W2897046351 doi "https://doi.org/10.1109/elnano.2018.8477448" @default.
• W2897046351 hasPublicationYear "2018" @default.
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