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• W2897932516 abstract "The study presents the behavior of a V concentration system (VCS), as a way to estimate the incident radiation on a flat surface, based on the solar coordinates described in the equations of Spencer, J.W. Increasing the areas of solar capture is a way to expand the solar radiation, captured on a flat surface by reflection. Maximizing the fraction of solar radiation captured; for that purpose, the V-Concentration System (VCS) was developed, adding four flat mirror surfaces to a flat surface, each with an inclination angle to the (flat) pickup surface. A statistical model was described to find a regression and thus expose the specific behavior areas of reflection on the (VCS), with the purpose of finding the optimal angle which achieves an increase in the uptake of radiation on a flat surface. Keywords:  V-Concentration System (VCS), Incident Radiation, Flat Surface, Solar Radiation, Reflection. Resumen Se presenta un estudio para observar el comportamiento de un sistema de concentracion en V (SCV), como medio para estimar la radiacion incidente sobre una superficie plana, con base en las coordenadas solares descritas en las ecuaciones de Spencer, J. W. Aumentar las areas de captacion solar es una forma para incrementar la radiacion solar capturada por una superficie plana por medio de la reflexion. Maximizando la fraccion de radicacion solar captada; para tal proposito fue desarrollado el sistema de concentracion en V (SCV), que agrega cuatro superficies de espejos planos a una superficie plana, cada una con un angulo de inclinacion respecto a la superficie de captacion (plana). De estos se elaboro un modelo estadistico para encontrar una regresion y asi exponer el comportamiento especifico de las areas de reflexion del (SCV), con el proposito de encontrar el angulo optimo que lograra un incremento en la captacion de radiacion sobre la superficie plana. Palabras clave: Sistema de concentracion en V (SCV), Radiacion incidente, Superficie plana, Radiacion solar, Reflexion. Resumo Um estudo e apresentado para observar o comportamento de um sistema de concentracao V (VCI), como um meio de estimar a radiacao incidente em uma superficie plana, com base nas coordenadas solares descritas nas equacoes de Spencer, J. W. Aumentar as areas de captacao solar e uma forma de aumentar a radiacao solar captada por uma superficie plana por meio da reflexao. Maximizar a fracao de radiacao solar capturada; Para este proposito, foi desenvolvido o sistema de concentracao em V (SCV), que adiciona quatro superficies de espelhos planos a uma superficie plana, cada uma com um ângulo de inclinacao em relacao a superficie de coleta (plana). A partir deles, um modelo estatistico foi desenvolvido para encontrar uma regressao e, assim, expor o comportamento especifico das areas de reflexao (SCV), a fim de encontrar o ângulo ideal que alcancaria um aumento na captacao de radiacao na superficie plana. Palavras-chave: V-Concentration System (SCV), Radiacao incidente, Superficie plana, Radiacao solar, Reflexao." @default.
• W2897932516 created "2018-10-26" @default.
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• W2897932516 date "2018-10-05" @default.
• W2897932516 modified "2023-09-24" @default.
• W2897932516 title "Evaluation of incident radiation by a V-Concentration System (VCS) in Bogotá, D.C." @default.
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• W2897932516 doi "https://doi.org/10.22335/rlct.v10i4.600" @default.
• W2897932516 hasPublicationYear "2018" @default.
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