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- W2911641671 abstract "High power laser diodes are fabricated using two different etchants by wet etching method. Sidewall roughness of the stripe in two cases is extracted using AFM and scattering loss due to this roughness is calculated theoretically by using well established model and exponential autocorrelation function for the roughness." @default.
- W2911641671 created "2019-02-21" @default.
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- W2911641671 date "2019-01-01" @default.
- W2911641671 modified "2023-09-27" @default.
- W2911641671 title "Estimation of Scattering Loss Due to Sidewall Roughness in High Power Laser Diodes" @default.
- W2911641671 cites W2011140664 @default.
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- W2911641671 doi "https://doi.org/10.1007/978-3-319-97604-4_146" @default.
- W2911641671 hasPublicationYear "2019" @default.
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