FRINK Linked Data Fragments server

Matches in SemOpenAlex for { <https://semopenalex.org/work/W2912449455> ?p ?o ?g. }

• W2912449455 abstract "Power electronic components' reliability depends, to a great extent, on the quality of die-attach technology. The voids appearance in the die-attach regions is almost unavoidable during the manufacturing process. The aim of this paper is to demonstrate that image processing tools enable fast and accurate void segmentation, while reducing manual interaction for X-ray monitoring of imperfect power transistor die soldering. The most common void parameters such as void area, void distribution, and shape roundness were extracted and used for statistical analysis." @default.
• W2912449455 created "2019-02-21" @default.
• W2912449455 creator A5054479916 @default.
• W2912449455 creator A5070015212 @default.
• W2912449455 creator A5075408643 @default.
• W2912449455 date "2019-03-04" @default.
• W2912449455 modified "2023-09-23" @default.
• W2912449455 title "Study on the Die-Attach Voids Distribution With X-Ray and Image Processing Techniques" @default.
• W2912449455 cites W125429368 @default.
• W2912449455 cites W1875009841 @default.
• W2912449455 cites W1969365487 @default.
• W2912449455 cites W1970889666 @default.
• W2912449455 cites W1993387975 @default.
• W2912449455 cites W1995450389 @default.
• W2912449455 cites W1996421418 @default.
• W2912449455 cites W2004125581 @default.
• W2912449455 cites W2014626166 @default.
• W2912449455 cites W2016206449 @default.
• W2912449455 cites W2020465198 @default.
• W2912449455 cites W2034338043 @default.
• W2912449455 cites W2047315796 @default.
• W2912449455 cites W2047417556 @default.
• W2912449455 cites W2071867169 @default.
• W2912449455 cites W2072260787 @default.
• W2912449455 cites W2082420451 @default.
• W2912449455 cites W2087738128 @default.
• W2912449455 cites W2100713112 @default.
• W2912449455 cites W2113199426 @default.
• W2912449455 cites W2126132395 @default.
• W2912449455 cites W2132653728 @default.
• W2912449455 cites W2132870717 @default.
• W2912449455 cites W2133059825 @default.
• W2912449455 cites W2145023731 @default.
• W2912449455 cites W2169431380 @default.
• W2912449455 cites W2254562123 @default.
• W2912449455 cites W2319535218 @default.
• W2912449455 cites W2332001931 @default.
• W2912449455 cites W2490495112 @default.
• W2912449455 cites W2517861920 @default.
• W2912449455 cites W2522568054 @default.
• W2912449455 cites W2540948977 @default.
• W2912449455 cites W2555204372 @default.
• W2912449455 doi "https://doi.org/10.1115/1.4042804" @default.
• W2912449455 hasPublicationYear "2019" @default.
• W2912449455 type Work @default.
• W2912449455 sameAs 2912449455 @default.
• W2912449455 citedByCount "3" @default.
• W2912449455 countsByYear W29124494552020 @default.
• W2912449455 countsByYear W29124494552021 @default.
• W2912449455 countsByYear W29124494552022 @default.
• W2912449455 crossrefType "journal-article" @default.
• W2912449455 hasAuthorship W2912449455A5054479916 @default.
• W2912449455 hasAuthorship W2912449455A5070015212 @default.
• W2912449455 hasAuthorship W2912449455A5075408643 @default.
• W2912449455 hasConcept C111106434 @default.
• W2912449455 hasConcept C115961682 @default.
• W2912449455 hasConcept C119599485 @default.
• W2912449455 hasConcept C127413603 @default.
• W2912449455 hasConcept C14190554 @default.
• W2912449455 hasConcept C154945302 @default.
• W2912449455 hasConcept C159985019 @default.
• W2912449455 hasConcept C165801399 @default.
• W2912449455 hasConcept C172385210 @default.
• W2912449455 hasConcept C192562407 @default.
• W2912449455 hasConcept C199639397 @default.
• W2912449455 hasConcept C24326235 @default.
• W2912449455 hasConcept C2779772531 @default.
• W2912449455 hasConcept C41008148 @default.
• W2912449455 hasConcept C50296614 @default.
• W2912449455 hasConcept C78519656 @default.
• W2912449455 hasConcept C9417928 @default.
• W2912449455 hasConceptScore W2912449455C111106434 @default.
• W2912449455 hasConceptScore W2912449455C115961682 @default.
• W2912449455 hasConceptScore W2912449455C119599485 @default.
• W2912449455 hasConceptScore W2912449455C127413603 @default.
• W2912449455 hasConceptScore W2912449455C14190554 @default.
• W2912449455 hasConceptScore W2912449455C154945302 @default.
• W2912449455 hasConceptScore W2912449455C159985019 @default.
• W2912449455 hasConceptScore W2912449455C165801399 @default.
• W2912449455 hasConceptScore W2912449455C172385210 @default.
• W2912449455 hasConceptScore W2912449455C192562407 @default.
• W2912449455 hasConceptScore W2912449455C199639397 @default.
• W2912449455 hasConceptScore W2912449455C24326235 @default.
• W2912449455 hasConceptScore W2912449455C2779772531 @default.
• W2912449455 hasConceptScore W2912449455C41008148 @default.
• W2912449455 hasConceptScore W2912449455C50296614 @default.
• W2912449455 hasConceptScore W2912449455C78519656 @default.
• W2912449455 hasConceptScore W2912449455C9417928 @default.
• W2912449455 hasIssue "2" @default.
• W2912449455 hasLocation W29124494551 @default.
• W2912449455 hasOpenAccess W2912449455 @default.
• W2912449455 hasPrimaryLocation W29124494551 @default.
• W2912449455 hasRelatedWork W1595003597 @default.
• W2912449455 hasRelatedWork W2001887691 @default.
• W2912449455 hasRelatedWork W2047527520 @default.
• W2912449455 hasRelatedWork W2057974772 @default.
• W2912449455 hasRelatedWork W2112862420 @default.
• W2912449455 hasRelatedWork W2185675158 @default.
• W2912449455 hasRelatedWork W2349302895 @default.
• W2912449455 hasRelatedWork W2367808879 @default.

• next