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- W2912533072 abstract "The characterisation of BaTiO 3 thin films by direct piezoelectric effect microscopy (DPFM) is presented. The technique allows for both the mapping of the polarisation of the surface, by imaging lines of constant electrostatic force over a polarised region, but also for the characterisation of the direct piezo coefficient, via the acoustically excited, lock-in demodulated, induced piezo-voltage response of the same region. The ability to objectively discriminate between piezo-effect and surface polarisation is crucial for the characterisation of artificial multiferroic stacks, where the polarisation response of buried layers can be masked by conductive caps, but the piezo response persists." @default.
- W2912533072 created "2019-02-21" @default.
- W2912533072 creator A5043088891 @default.
- W2912533072 creator A5045541185 @default.
- W2912533072 date "2018-07-01" @default.
- W2912533072 modified "2023-09-26" @default.
- W2912533072 title "Direct Piezoelectric Force Microscopy: Applications Towards the Characterisation of Multiferroic stacks" @default.
- W2912533072 cites W1559694135 @default.
- W2912533072 doi "https://doi.org/10.1109/nano.2018.8626409" @default.
- W2912533072 hasPublicationYear "2018" @default.
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