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- W2913574102 abstract "The combined focused ion beam microscope-scanning electron microscope (FIB-SEM) instrument has been used for many biomaterials applications over the years. This chapter emphasize the use of FIB-SEM for non-cryo-applications and presents examples for the study of dental implants and soft biomaterials that are made vacuum compatible (e.g., via staining and plastic embedding or critical point drying). The added benefit to the FIB-SEM is that both the ion and electron beams can be positioned into coincidence such that the SEM can directly view and end-point FIB milling operations without stage tilting or rotation. Multi-signal SEM tomography is advantageous because it allows the collection of either secondary electron (SE) or backscattered electron (BSE) signals. The SE signal is best suited for imaging topography while the BSE signal is ideal for identifying multi-phase samples. Since an FIB milled face is smooth, the SE signal is most useful for imaging internal topography such as voids or porosity." @default.
- W2913574102 created "2019-02-21" @default.
- W2913574102 creator A5036540094 @default.
- W2913574102 date "2019-02-15" @default.
- W2913574102 modified "2023-09-25" @default.
- W2913574102 title "FIB-SEM for Biomaterials" @default.
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- W2913574102 doi "https://doi.org/10.1002/9781118663233.ch24" @default.
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