FRINK Linked Data Fragments server

Matches in SemOpenAlex for { <https://semopenalex.org/work/W2913692241> ?p ?o ?g. }

• W2913692241 endingPage "194" @default.
• W2913692241 startingPage "194" @default.
• W2913692241 abstract "Silicon carbide (SiC) has been widely used for electronic radiation detectors and atomic battery sensors. However, the physical properties of SiC exposure to high-dose irradiation as well as its related electrical responses are not yet well understood. Meanwhile, the current research in this field are generally focused on electrical properties and defects formation, which are not suitable to explain the intrinsic response of irradiation effect since defect itself is not easy to characterize, and it is complex to determine whether it comes from the raw material or exists only upon irradiation. Therefore, a more straightforward quantification of irradiation effect is needed to establish the direct correlation between irradiation-induced current and the radiation fluence. This work reports the on-line electrical properties of 4H-SiC Schottky barrier diodes (SBDs) under high-dose electron irradiation and employs in situ noise diagnostic analysis to demonstrate the correlation of irradiation-induced defects and microscopic electronic properties. It is found that the electron beam has a strong radiation destructive effect on 4H-SiC SBDs. The on-line electron-induced current and noise information reveal a self-healing like procedure, in which the internal defects of the devices are likely to be annealed at room temperature and devices’ performance is restored to some extent." @default.
• W2913692241 created "2019-02-21" @default.
• W2913692241 creator A5003549337 @default.
• W2913692241 creator A5011581125 @default.
• W2913692241 creator A5014433352 @default.
• W2913692241 creator A5022001222 @default.
• W2913692241 creator A5033751081 @default.
• W2913692241 creator A5034838582 @default.
• W2913692241 creator A5036979558 @default.
• W2913692241 creator A5045067652 @default.
• W2913692241 creator A5059622392 @default.
• W2913692241 creator A5059722884 @default.
• W2913692241 creator A5062631493 @default.
• W2913692241 creator A5075282693 @default.
• W2913692241 date "2019-02-02" @default.
• W2913692241 modified "2023-10-16" @default.
• W2913692241 title "High-Dose Electron Radiation and Unexpected Room-Temperature Self-Healing of Epitaxial SiC Schottky Barrier Diodes" @default.
• W2913692241 cites W1930256800 @default.
• W2913692241 cites W1964370724 @default.
• W2913692241 cites W1971533411 @default.
• W2913692241 cites W1972573822 @default.
• W2913692241 cites W1974402048 @default.
• W2913692241 cites W1977238543 @default.
• W2913692241 cites W1977920155 @default.
• W2913692241 cites W1979399396 @default.
• W2913692241 cites W1987876515 @default.
• W2913692241 cites W1994361850 @default.
• W2913692241 cites W2002543097 @default.
• W2913692241 cites W2006121609 @default.
• W2913692241 cites W2020164307 @default.
• W2913692241 cites W2054546674 @default.
• W2913692241 cites W2054811546 @default.
• W2913692241 cites W2056882812 @default.
• W2913692241 cites W2059207462 @default.
• W2913692241 cites W2060801253 @default.
• W2913692241 cites W2063407695 @default.
• W2913692241 cites W2068334110 @default.
• W2913692241 cites W2077520647 @default.
• W2913692241 cites W2084519062 @default.
• W2913692241 cites W2087588623 @default.
• W2913692241 cites W2107405723 @default.
• W2913692241 cites W2108676482 @default.
• W2913692241 cites W2111878314 @default.
• W2913692241 cites W2126702603 @default.
• W2913692241 cites W2127229285 @default.
• W2913692241 cites W2140624791 @default.
• W2913692241 cites W2142453464 @default.
• W2913692241 cites W2147544700 @default.
• W2913692241 cites W2149961997 @default.
• W2913692241 cites W2155969312 @default.
• W2913692241 cites W2160777716 @default.
• W2913692241 cites W2165965398 @default.
• W2913692241 cites W2168158156 @default.
• W2913692241 cites W2171596841 @default.
• W2913692241 cites W2333897142 @default.
• W2913692241 cites W2419937534 @default.
• W2913692241 doi "https://doi.org/10.3390/nano9020194" @default.
• W2913692241 hasPubMedCentralId "https://www.ncbi.nlm.nih.gov/pmc/articles/6410155" @default.
• W2913692241 hasPubMedId "https://pubmed.ncbi.nlm.nih.gov/30717417" @default.
• W2913692241 hasPublicationYear "2019" @default.
• W2913692241 type Work @default.
• W2913692241 sameAs 2913692241 @default.
• W2913692241 citedByCount "8" @default.
• W2913692241 countsByYear W29136922412019 @default.
• W2913692241 countsByYear W29136922412020 @default.
• W2913692241 countsByYear W29136922412022 @default.
• W2913692241 countsByYear W29136922412023 @default.
• W2913692241 crossrefType "journal-article" @default.
• W2913692241 hasAuthorship W2913692241A5003549337 @default.
• W2913692241 hasAuthorship W2913692241A5011581125 @default.
• W2913692241 hasAuthorship W2913692241A5014433352 @default.
• W2913692241 hasAuthorship W2913692241A5022001222 @default.
• W2913692241 hasAuthorship W2913692241A5033751081 @default.
• W2913692241 hasAuthorship W2913692241A5034838582 @default.
• W2913692241 hasAuthorship W2913692241A5036979558 @default.
• W2913692241 hasAuthorship W2913692241A5045067652 @default.
• W2913692241 hasAuthorship W2913692241A5059622392 @default.
• W2913692241 hasAuthorship W2913692241A5059722884 @default.
• W2913692241 hasAuthorship W2913692241A5062631493 @default.
• W2913692241 hasAuthorship W2913692241A5075282693 @default.
• W2913692241 hasBestOaLocation W29136922411 @default.
• W2913692241 hasConcept C105163801 @default.
• W2913692241 hasConcept C111337013 @default.
• W2913692241 hasConcept C120665830 @default.
• W2913692241 hasConcept C121332964 @default.
• W2913692241 hasConcept C153385146 @default.
• W2913692241 hasConcept C153428861 @default.
• W2913692241 hasConcept C159985019 @default.
• W2913692241 hasConcept C16115445 @default.
• W2913692241 hasConcept C185544564 @default.
• W2913692241 hasConcept C192562407 @default.
• W2913692241 hasConcept C205200001 @default.
• W2913692241 hasConcept C22078206 @default.
• W2913692241 hasConcept C2780722187 @default.
• W2913692241 hasConcept C49040817 @default.
• W2913692241 hasConcept C544956773 @default.
• W2913692241 hasConcept C78434282 @default.
• W2913692241 hasConceptScore W2913692241C105163801 @default.

• next