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- W2913972407 abstract "The degradation behaviors of flip-chip 260 nm ultraviolet light emitting diodes (UVC-LEDs) were studied using in-situ accelerated system and different analytical technologies. The optical power of LEDs stressed at a constant DC current of 20 mA decreased to ~63% of the initial value after 150 h of operation. The failure mechanisms were investigated systematically by using current-voltage measurements, Secondary Ion Mass Spectroscopy, Transient Thermal Analysis, Scan Electron Microscopy, etc. The results show that: the concentration of H in p-GaN layer decreased from 4.5e17 atoms/cm3 for the unstressed samples to 6.0e16 atoms/cm3 for stressed sample, while there is no change for the Mg concentration, indicating the hydrogen dissociated from the Mg-H complex resulting from the activation of the Mg-dopant during the initial period; the increase of the current for the reverse bias region and the low-forward bias region during stress is due to the increase of defect-assisted carrier tunneling; the electro-migration of contact metal may generate the current leakage channel, which degraded the optical power of the LEDs. These results will help to improve the reliability design of AlGaN-based deep-UV LEDs." @default.
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- W2913972407 date "2019-06-01" @default.
- W2913972407 modified "2023-10-17" @default.
- W2913972407 title "Degradation and failure mechanism of AlGaN-based UVC-LEDs" @default.
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- W2913972407 doi "https://doi.org/10.1016/j.sse.2019.01.004" @default.
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