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• W2915545947 abstract "This paper introduces a Monte Carlo (MC) approach based on the binary collision approximation to estimate defect types and densities in proton- and heavy-ion-irradiated graphene layers. The types and concentrations of defects that appear in graphene due to irradiation with various ions with energies ranging from ~100 keV to ~100 MeV are identified. This simple method enables defect introduction rates in graphene to be predicted to within better than a factor of two accuracy, relative to experimental measurements in a beam environment. The results demonstrate that all defects generated by ions with high incident energy are formed via head-on collisions and in-plane recoils, which is unique for 2-D materials." @default.
• W2915545947 created "2019-03-02" @default.
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• W2915545947 date "2019-07-01" @default.
• W2915545947 modified "2023-09-24" @default.
• W2915545947 title "Monte Carlo Simulation of Displacement Damage in Graphene" @default.
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• W2915545947 doi "https://doi.org/10.1109/tns.2019.2899579" @default.
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