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• W2935886607 abstract "We demonstrate normally-off 400 °C operation of n-channel and p-channel junction field-effect transistors (JFETs) fabricated by an ion implantation into a common high-purity semi-insulating silicon carbide (SiC) substrate. The side-gate structure proposed in this letter has good controllability of threshold voltage. The present results assure the potential of JFET-based complementary logic integrated circuits (ICs) operational at high temperature." @default.
• W2935886607 created "2019-04-25" @default.
• W2935886607 creator A5016537147 @default.
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• W2935886607 date "2019-06-01" @default.
• W2935886607 modified "2023-09-25" @default.
• W2935886607 title "Normally-off 400 °C Operation of n- and p-JFETs With a Side-Gate Structure Fabricated by Ion Implantation Into a High-Purity Semi-Insulating SiC Substrate" @default.
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• W2935886607 doi "https://doi.org/10.1109/led.2019.2910598" @default.
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