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• W2936073306 abstract "Abstract The measurement of minority carrier lifetimes is vital to determining the material quality and operational bandwidth of a broad range of optoelectronic devices. Typically, these measurements are made by recording the temporal decay of a carrier-concentration-dependent material property following pulsed optical excitation. Such approaches require some combination of efficient emission from the material under test, specialized collection optics, large sample areas, spatially uniform excitation, and/or the fabrication of ohmic contacts, depending on the technique used. In contrast, here we introduce a technique that provides electrical readout of minority carrier lifetimes using a passive microwave resonator circuit. We demonstrate >10 5 improvement in sensitivity, compared with traditional photoemission decay experiments and the ability to measure carrier dynamics in micron-scale volumes, much smaller than is possible with other techniques. The approach presented is applicable to a wide range of 2D, micro-, or nano-scaled materials, as well as weak emitters or non-radiative materials." @default.
• W2936073306 created "2019-04-25" @default.
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• W2936073306 date "2019-04-09" @default.
• W2936073306 modified "2023-10-14" @default.
• W2936073306 title "Measurement of carrier lifetime in micron-scaled materials using resonant microwave circuits" @default.
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• W2936073306 doi "https://doi.org/10.1038/s41467-019-09602-2" @default.
• W2936073306 hasPubMedCentralId "https://www.ncbi.nlm.nih.gov/pmc/articles/6456730" @default.
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