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• W2943508746 abstract "The thermal runaway in SiC Schottky barrier diodes (SBDs) caused by heavy ions was identified by a device simulator with parameters carefully extrapolated to an extended temperature range far exceeding the melting point of SiC. It is shown that the critical electric field needed to activate the impact ionization attributable to SiC material and the Schottky barrier contact on it are responsible for the thermal runaway in SiC SBDs." @default.
• W2943508746 created "2019-05-09" @default.
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• W2943508746 date "2019-07-01" @default.
• W2943508746 modified "2023-10-18" @default.
• W2943508746 title "Thermal Runaway in SiC Schottky Barrier Diodes Caused by Heavy Ions" @default.
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• W2943508746 doi "https://doi.org/10.1109/tns.2019.2914494" @default.
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