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• W2943717183 abstract "Potential induced degradation (PID) is still a serious threat for the photovoltaic (PV) industry and it is expected to aggravate due to the tendency to increase the operating voltage of PV systems. Therefore, a method which can detect PID at an infant stage is necessary in order to increase the reliability of PV systems and preserve their lifetime. This paper provides a pathway (proof of concept) for the early and reliable detection of PID, by using the forward dc resistance (FDCR) of a PV cell since it is a parameter, which is affected by the cell's shunt resistance ( <italic xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>R</i> <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>sh</sub> ), which in turn is heavily affected by PID before any significant power loss occurs, and could act as a PID detection mechanism. The paper presents simulation results, which examine at which forward bias conditions the FDCR has to be measured for the purpose of using it as a PID detection means at an early stage (<1% power loss). The simulation examined the FDCR variation with shunt resistance, reverse dark saturation current ( <italic xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>I</i> <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>0</sub> ), and ideality factor ( <italic xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>n</i> ). Furthermore, an experiment was performed to verify the simulation results, demonstrating detection before 2% power loss occurs." @default.
• W2943717183 created "2019-05-09" @default.
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• W2943717183 date "2019-07-01" @default.
• W2943717183 modified "2023-09-27" @default.
• W2943717183 title "Early Detection of Potential Induced Degradation by Measurement of the Forward DC Resistance in Crystalline PV Cells" @default.
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• W2943717183 doi "https://doi.org/10.1109/jphotov.2019.2910235" @default.
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