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- W2945756806 endingPage "1396" @default.
- W2945756806 startingPage "1384" @default.
- W2945756806 abstract "Interfaces play a fundamental role in many areas of chemistry. However, their localized nature requires characterization techniques with high spatial resolution in order to fully understand their structure and properties. State-of-the-art atomic resolution or in situ scanning transmission electron microscopy and electron energy-loss spectroscopy are indispensable tools for characterizing the local structure and chemistry of materials with single-atom resolution, but they are not able to measure many properties that dictate function, such as vibrational modes or charge transfer, and are limited to room-temperature samples containing no liquids. Here, we outline emerging electron microscopy techniques that are allowing these limitations to be overcome and highlight several recent studies that were enabled by these techniques. We then provide a vision for how these techniques can be paired with each other and with in situ methods to deliver new insights into the static and dynamic behavior of functional interfaces." @default.
- W2945756806 created "2019-05-29" @default.
- W2945756806 creator A5031020271 @default.
- W2945756806 creator A5046838323 @default.
- W2945756806 creator A5051615060 @default.
- W2945756806 creator A5080185216 @default.
- W2945756806 date "2019-10-16" @default.
- W2945756806 modified "2023-09-30" @default.
- W2945756806 title "Emerging Electron Microscopy Techniques for Probing Functional Interfaces in Energy Materials" @default.
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