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- W2946248220 abstract "This project includes comparison of the advantages of enhanced SiC deviceperformance at elevated temperatures over Si devices in a buck type DC/DCconverter circuit. Being that elevated temperatures in a circuit have always causedenergy losses and deviation in results, the manufacturers of silicon technology cameup with a much more sophisticated Silicon Carbide technology which dramaticallyreduces the above mentioned two factors. The scope is mainly to examine thermaleffects at high temperatures on the performance characteristics of the buck convertercircuit, diode losses, switching losses and overall system losses. This project alsoincludes effect of noise integrated buck converter circuit. So, comparison is beingmade between that of noise integrated and noiseless circuit both of which are beingvaried from a low temperature up to temperature of 300 Celsius. This project mainlyutilizes PSPICE software to achieve the above stated results. Reasons and causes as tothe increase of losses as the increase of temperature have been discussed in thisproject. Also the source of noise and practical ways of reducing noises in buckconverter circuits is being stated in this project. Withpropertabulation and graphs ofresults this project enables to deeply understand Silicon Carbide technology used inbuck converter circuit, which is a subject to elevated temperatures and noise." @default.
- W2946248220 created "2019-05-29" @default.
- W2946248220 creator A5045378411 @default.
- W2946248220 date "2004-11-22" @default.
- W2946248220 modified "2023-09-26" @default.
- W2946248220 title "High Temperature Testingand Noise Integration of a Buck Converter usingSiliconand Silicon Carbide Diodes." @default.
- W2946248220 hasPublicationYear "2004" @default.
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