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• W2950984326 endingPage "1918" @default.
• W2950984326 startingPage "1903" @default.
• W2950984326 abstract "Copper(I) oxide films formed under open-circuit potential in neutral aqueous solutions have been characterized, using coulometry, photocurrent spectroscopy and X-ray photo-electron spectroscopy (XPS). The reduction potential of the oxide layer was found to depend on the presence in the electrolyte of chloride ions, Cu(II) or Cu(I) ionic species or of a corrosion inhibitor. XPS analyses were performed on these oxide layers, and showed in some cases an evolution of the oxidation state of copper from + 2 to + 1 state throughout the film. Different conducting properties of the cuprous oxides could be demonstrated through photo-electrochemical measurements, and the formation of a duplex Cu2O layer with two semiconducting components of different stoichiometries was discussed." @default.
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• W2950984326 date "1995-12-01" @default.
• W2950984326 modified "2023-10-10" @default.
• W2950984326 title "A correlation between electrochemical behaviour, composition and semiconducting properties of naturally grown oxide films on copper" @default.
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• W2950984326 doi "https://doi.org/10.1016/0010-938x(95)00072-r" @default.
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