FRINK Linked Data Fragments server

Matches in SemOpenAlex for { <https://semopenalex.org/work/W2955188846> ?p ?o ?g. }

• W2955188846 endingPage "137415" @default.
• W2955188846 startingPage "137415" @default.
• W2955188846 abstract "Abstract The purpose of this research was to investigate the applicability of competitive growth theory on the texture evolution of vanadium nitride (VN) thin films, and the effect of texture on the mechanical properties of VN thin films was also studied. VN thin films were deposited using unbalanced magnetron sputtering. The preferred orientation was controlled by adjusting nitrogen flow rate, deposition temperature, substrate bias, and target current. For the VN thin films with texture ranging from (200) to random (group I), the preferred orientation gradually changed from (200) to random texture with increasing nitrogen flow rate. VN thin films with (111)-dominant texture (group II) could be deposited with increasing nitrogen flow rate and under low energy conditions with lower temperature, substrate bias and target current. Considering the similarity of atomic configuration, the formation of (200) plane of VN (NaCl structure) may follow the (110) preferred atomic configuration in body-centered cubic-structure vanadium base metal. In addition to the competitive growth theory, the steering effect due to base metal structure may be an important factor for the texture evolution of the corresponding transition-metal nitrides. The accompanying microstructure and mechanical properties were also divided into two groups following texture coefficient. The film microstructure in group I belonged to zone T structure with dense columnar structure and smooth surface, while that in group II had zone I structure with loose columnar structure and rough surface. The film hardness in group I was about 30 GPa and weakly texture-dependent, while that in group II was quite low and texture dependent ranging from 5.7 to 11.4 GPa. The residual stress of films in region I decreased from −5.66 to −2.66 GPa with increasing (111) texture coefficient, while that in group II was mostly relieved due to loose microstructure, ranging from −0.44 to 0.45 GPa. The electrical resistivity of the understoichiometric samples was higher than that of stoichiometric samples except for the sample with (111)-dominant texture. In addition, loose-packed microstructure also causes higher electrical resistivity." @default.
• W2955188846 created "2019-07-12" @default.
• W2955188846 creator A5049628098 @default.
• W2955188846 creator A5051557958 @default.
• W2955188846 creator A5079602917 @default.
• W2955188846 date "2019-10-01" @default.
• W2955188846 modified "2023-10-17" @default.
• W2955188846 title "Texture evolution of vanadium nitride thin films" @default.
• W2955188846 cites W1019596528 @default.
• W2955188846 cites W1964419134 @default.
• W2955188846 cites W1976330283 @default.
• W2955188846 cites W1980504091 @default.
• W2955188846 cites W1985379293 @default.
• W2955188846 cites W1991042287 @default.
• W2955188846 cites W2000883834 @default.
• W2955188846 cites W2004856493 @default.
• W2955188846 cites W2011044189 @default.
• W2955188846 cites W2013734654 @default.
• W2955188846 cites W2020892161 @default.
• W2955188846 cites W2022157502 @default.
• W2955188846 cites W2037954148 @default.
• W2955188846 cites W2042284106 @default.
• W2955188846 cites W2049425150 @default.
• W2955188846 cites W2052968904 @default.
• W2955188846 cites W2054939277 @default.
• W2955188846 cites W2061297676 @default.
• W2955188846 cites W2063458399 @default.
• W2955188846 cites W2065138335 @default.
• W2955188846 cites W2065586390 @default.
• W2955188846 cites W2066874036 @default.
• W2955188846 cites W2067589539 @default.
• W2955188846 cites W2071142872 @default.
• W2955188846 cites W2074930724 @default.
• W2955188846 cites W2079886486 @default.
• W2955188846 cites W2085391475 @default.
• W2955188846 cites W2086933933 @default.
• W2955188846 cites W2087261896 @default.
• W2955188846 cites W2087611624 @default.
• W2955188846 cites W2089860840 @default.
• W2955188846 cites W2090250645 @default.
• W2955188846 cites W2091245496 @default.
• W2955188846 cites W2109157932 @default.
• W2955188846 cites W2113947704 @default.
• W2955188846 cites W2128805661 @default.
• W2955188846 cites W2173208820 @default.
• W2955188846 cites W2180898129 @default.
• W2955188846 cites W2395505534 @default.
• W2955188846 cites W2474250301 @default.
• W2955188846 cites W2905149779 @default.
• W2955188846 doi "https://doi.org/10.1016/j.tsf.2019.137415" @default.
• W2955188846 hasPublicationYear "2019" @default.
• W2955188846 type Work @default.
• W2955188846 sameAs 2955188846 @default.
• W2955188846 citedByCount "19" @default.
• W2955188846 countsByYear W29551888462020 @default.
• W2955188846 countsByYear W29551888462021 @default.
• W2955188846 countsByYear W29551888462022 @default.
• W2955188846 countsByYear W29551888462023 @default.
• W2955188846 crossrefType "journal-article" @default.
• W2955188846 hasAuthorship W2955188846A5049628098 @default.
• W2955188846 hasAuthorship W2955188846A5051557958 @default.
• W2955188846 hasAuthorship W2955188846A5079602917 @default.
• W2955188846 hasConcept C115961682 @default.
• W2955188846 hasConcept C127413603 @default.
• W2955188846 hasConcept C154945302 @default.
• W2955188846 hasConcept C159985019 @default.
• W2955188846 hasConcept C171250308 @default.
• W2955188846 hasConcept C185592680 @default.
• W2955188846 hasConcept C19067145 @default.
• W2955188846 hasConcept C191897082 @default.
• W2955188846 hasConcept C192562407 @default.
• W2955188846 hasConcept C194760766 @default.
• W2955188846 hasConcept C199289684 @default.
• W2955188846 hasConcept C2778672287 @default.
• W2955188846 hasConcept C2779227376 @default.
• W2955188846 hasConcept C2781195486 @default.
• W2955188846 hasConcept C41008148 @default.
• W2955188846 hasConcept C42360764 @default.
• W2955188846 hasConcept C504678139 @default.
• W2955188846 hasConceptScore W2955188846C115961682 @default.
• W2955188846 hasConceptScore W2955188846C127413603 @default.
• W2955188846 hasConceptScore W2955188846C154945302 @default.
• W2955188846 hasConceptScore W2955188846C159985019 @default.
• W2955188846 hasConceptScore W2955188846C171250308 @default.
• W2955188846 hasConceptScore W2955188846C185592680 @default.
• W2955188846 hasConceptScore W2955188846C19067145 @default.
• W2955188846 hasConceptScore W2955188846C191897082 @default.
• W2955188846 hasConceptScore W2955188846C192562407 @default.
• W2955188846 hasConceptScore W2955188846C194760766 @default.
• W2955188846 hasConceptScore W2955188846C199289684 @default.
• W2955188846 hasConceptScore W2955188846C2778672287 @default.
• W2955188846 hasConceptScore W2955188846C2779227376 @default.
• W2955188846 hasConceptScore W2955188846C2781195486 @default.
• W2955188846 hasConceptScore W2955188846C41008148 @default.
• W2955188846 hasConceptScore W2955188846C42360764 @default.
• W2955188846 hasConceptScore W2955188846C504678139 @default.
• W2955188846 hasLocation W29551888461 @default.
• W2955188846 hasOpenAccess W2955188846 @default.

• next