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• W2959098474 abstract "Negative biasing of the gate voltage in a scaled insulated gate bipolar transistor (IGBT) during the off-state was modeled and found to be effective against self-turn-on failures. The required self-turn-on-free criteria were verified experimentally." @default.
• W2959098474 created "2019-07-23" @default.
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• W2959098474 date "2019-05-01" @default.
• W2959098474 modified "2023-10-01" @default.
• W2959098474 title "Self-Turn-on-Free 5V Gate Driving for 1200V Scaled IGBT" @default.
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• W2959098474 doi "https://doi.org/10.1109/ispsd.2019.8757665" @default.
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