Matches in SemOpenAlex for { <https://semopenalex.org/work/W2962487100> ?p ?o ?g. }
Showing items 1 to 83 of
83
with 100 items per page.
- W2962487100 endingPage "721" @default.
- W2962487100 startingPage "714" @default.
- W2962487100 abstract "To support the current level of integration beyond 22 nm, the FinFET architecture is introduced with the expectation of greater levels of device matching. An additional mechanism, arising from charges present at points of disturbance in the silicon lattice in tapering and wavering fins is shown to contribute significantly to transistor mismatch. As the fin is being tapered, quantum mechanical effects come into scene, which contribute to threshold voltage mismatch in the device. This atomic level jogs arise along the taper length of the device can introduce a significant amount of unpassivated charges along the fin. We show that including this mechanism can improve the quantitative understanding of mismatch in FinFETs. For this purpose, an ideal FDSOI FinFET with various fin angles are considered. The existing models are not in agreement with these effects to understand the device better. An analytical model is necessary to relate this mismatch due to differences in threshold voltages with fin angle variation which helps to analyse the influence of the FinFET sidewall inclination angle on the threshold voltage. Threshold voltage and intrinsic trap variations for various fin angles and surface charge densities are measured for analytical study. An optimized threshold voltage equation including the effects of quantum mechanism and channel reduction is developed. The simulations are done through a 3D TCAD simulator Atlas Silvaco and validation of model has done in MATLAB tool." @default.
- W2962487100 created "2019-07-23" @default.
- W2962487100 creator A5031098052 @default.
- W2962487100 creator A5041866791 @default.
- W2962487100 creator A5046543502 @default.
- W2962487100 creator A5047836195 @default.
- W2962487100 date "2019-06-06" @default.
- W2962487100 modified "2023-09-26" @default.
- W2962487100 title "Fin Angle Variation Oriented Threshold Voltage Model for a FDSOI FinFET" @default.
- W2962487100 cites W1976569134 @default.
- W2962487100 cites W1995035559 @default.
- W2962487100 cites W1996246904 @default.
- W2962487100 cites W2016619328 @default.
- W2962487100 cites W2028346948 @default.
- W2962487100 cites W2036713195 @default.
- W2962487100 cites W2039382918 @default.
- W2962487100 cites W2087280430 @default.
- W2962487100 cites W2097286457 @default.
- W2962487100 cites W2114644969 @default.
- W2962487100 cites W2164422767 @default.
- W2962487100 cites W2584571601 @default.
- W2962487100 doi "https://doi.org/10.1080/03772063.2019.1620646" @default.
- W2962487100 hasPublicationYear "2019" @default.
- W2962487100 type Work @default.
- W2962487100 sameAs 2962487100 @default.
- W2962487100 citedByCount "1" @default.
- W2962487100 countsByYear W29624871002023 @default.
- W2962487100 crossrefType "journal-article" @default.
- W2962487100 hasAuthorship W2962487100A5031098052 @default.
- W2962487100 hasAuthorship W2962487100A5041866791 @default.
- W2962487100 hasAuthorship W2962487100A5046543502 @default.
- W2962487100 hasAuthorship W2962487100A5047836195 @default.
- W2962487100 hasConcept C114138010 @default.
- W2962487100 hasConcept C121332964 @default.
- W2962487100 hasConcept C121684516 @default.
- W2962487100 hasConcept C159985019 @default.
- W2962487100 hasConcept C165801399 @default.
- W2962487100 hasConcept C172385210 @default.
- W2962487100 hasConcept C192562407 @default.
- W2962487100 hasConcept C195370968 @default.
- W2962487100 hasConcept C30475298 @default.
- W2962487100 hasConcept C41008148 @default.
- W2962487100 hasConcept C49040817 @default.
- W2962487100 hasConcept C53143962 @default.
- W2962487100 hasConcept C544956773 @default.
- W2962487100 hasConcept C62520636 @default.
- W2962487100 hasConcept C91721477 @default.
- W2962487100 hasConceptScore W2962487100C114138010 @default.
- W2962487100 hasConceptScore W2962487100C121332964 @default.
- W2962487100 hasConceptScore W2962487100C121684516 @default.
- W2962487100 hasConceptScore W2962487100C159985019 @default.
- W2962487100 hasConceptScore W2962487100C165801399 @default.
- W2962487100 hasConceptScore W2962487100C172385210 @default.
- W2962487100 hasConceptScore W2962487100C192562407 @default.
- W2962487100 hasConceptScore W2962487100C195370968 @default.
- W2962487100 hasConceptScore W2962487100C30475298 @default.
- W2962487100 hasConceptScore W2962487100C41008148 @default.
- W2962487100 hasConceptScore W2962487100C49040817 @default.
- W2962487100 hasConceptScore W2962487100C53143962 @default.
- W2962487100 hasConceptScore W2962487100C544956773 @default.
- W2962487100 hasConceptScore W2962487100C62520636 @default.
- W2962487100 hasConceptScore W2962487100C91721477 @default.
- W2962487100 hasIssue "1" @default.
- W2962487100 hasLocation W29624871001 @default.
- W2962487100 hasOpenAccess W2962487100 @default.
- W2962487100 hasPrimaryLocation W29624871001 @default.
- W2962487100 hasRelatedWork W2027381561 @default.
- W2962487100 hasRelatedWork W2043346829 @default.
- W2962487100 hasRelatedWork W2102179273 @default.
- W2962487100 hasRelatedWork W2105180128 @default.
- W2962487100 hasRelatedWork W2150287163 @default.
- W2962487100 hasRelatedWork W2152101054 @default.
- W2962487100 hasRelatedWork W2253356713 @default.
- W2962487100 hasRelatedWork W2537937582 @default.
- W2962487100 hasRelatedWork W3100885724 @default.
- W2962487100 hasRelatedWork W3116133911 @default.
- W2962487100 hasVolume "68" @default.
- W2962487100 isParatext "false" @default.
- W2962487100 isRetracted "false" @default.
- W2962487100 magId "2962487100" @default.
- W2962487100 workType "article" @default.