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- W2966734320 abstract "Journal Article Analysis of Elemental Composition of Fe1−xNix and Si1−xGex Alloy Thin Films by EPMA and μ-XRF Get access Vasile-Dan Hodoroaba, Vasile-Dan Hodoroaba Federal Institute for Materials Research and Testing (BAM), Division 6.1 Surface Analysis and Interfacial Chemistry, Berlin, Germany Search for other works by this author on: Oxford Academic Google Scholar Ralf Terborg, Ralf Terborg Bruker Nano GmbH, Berlin, Germany Search for other works by this author on: Oxford Academic Google Scholar Stephan Böhm, Stephan Böhm Bruker Nano GmbH, Berlin, Germany Search for other works by this author on: Oxford Academic Google Scholar Kyung Joong Kim Kyung Joong Kim Korea Research Institute of Standards and Science (KRISS), Division of Industrial Metrology, Daejeon, Korea Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 1786–1787, https://doi.org/10.1017/S1431927619009668 Published: 01 August 2019" @default.
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- W2966734320 date "2019-08-01" @default.
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- W2966734320 title "Analysis of Elemental Composition of Fe<sub>1−x</sub>Ni<sub>x</sub> and Si<sub>1−x</sub>Ge<sub>x</sub> Alloy Thin Films by EPMA and μ-XRF" @default.
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