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- W2971325110 abstract "As digital circuits grow in complexity, and as they are used in more and more critical applications, their reliability becomes an important consideration. This directs the attention of researchers involved in this field to two basic questions— first, how to design more reliable systems; second, how can something be said about the reliability of a particular system?" @default.
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- W2971325110 date "1899-12-30" @default.
- W2971325110 modified "2023-09-23" @default.
- W2971325110 title "A survey of methods for intermittent fault analysis" @default.
- W2971325110 doi "https://doi.org/10.1109/afips.1979.19" @default.
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