FRINK Linked Data Fragments server

Matches in SemOpenAlex for { <https://semopenalex.org/work/W2978365280> ?p ?o ?g. }

• W2978365280 endingPage "691" @default.
• W2978365280 startingPage "680" @default.
• W2978365280 abstract "The semiconductor industry ramping up design capabilities for emerging technologies is facing new test quality and yield management challenges. To facilitate debugging of the first silicon, diagnosis of yield issues, and to enable repair processes, an accurate defect isolation is needed with support of advanced test, diagnostic, and yield analysis tools. Laser voltage imaging (LVI), laser voltage probing (LVP), and electron-beam testing are popular diagnostic techniques for scan chain failures. As scan remains instrumental in developing more advanced DFT technologies, its reliable operations are essential for test pattern bring-up, failure analysis, and yield learning. Running LVI tests at early stages of a design process involves a sophisticated infrastructure to offer a nanometer diagnostic resolution with a non-destructive failure isolation. However, as the use of external testers may not be feasible besides providing power and clock signals, the paper demonstrates how to reuse on-chip EDT compression environment to generate and apply LVI-aware scan patterns for advanced contactless test procedures. The presented approach avoids the repetitive loading of scan chains, requires no seed patterns to encode LVI tests, has virtually no area overhead, and offers a flexible selection of non-toggling scan chains in a low power test mode. Furthermore, there are no constraints or requirements imposed by designs that could limit the applicability of the scheme. The proposed solution does not compromise the test compression performance, marked by test data reduction ratios, test coverage, and test time. Hence, there are no modifications needed in existing flows and tools to implement the method besides the use of recommended polynomials." @default.
• W2978365280 created "2019-10-10" @default.
• W2978365280 creator A5020407423 @default.
• W2978365280 creator A5028356877 @default.
• W2978365280 creator A5046691899 @default.
• W2978365280 creator A5072675590 @default.
• W2978365280 creator A5074272792 @default.
• W2978365280 creator A5080960636 @default.
• W2978365280 date "2021-04-01" @default.
• W2978365280 modified "2023-10-18" @default.
• W2978365280 title "Autonomous Scan Patterns for Laser Voltage Imaging" @default.
• W2978365280 cites W1983122941 @default.
• W2978365280 cites W2021187601 @default.
• W2978365280 cites W2037589385 @default.
• W2978365280 cites W2038232991 @default.
• W2978365280 cites W2064235357 @default.
• W2978365280 cites W2071464394 @default.
• W2978365280 cites W2078264763 @default.
• W2978365280 cites W2098385231 @default.
• W2978365280 cites W2099226121 @default.
• W2978365280 cites W2101900253 @default.
• W2978365280 cites W2108361034 @default.
• W2978365280 cites W2121266668 @default.
• W2978365280 cites W2138551793 @default.
• W2978365280 cites W2142308491 @default.
• W2978365280 cites W2153126169 @default.
• W2978365280 cites W2536095564 @default.
• W2978365280 cites W2762263503 @default.
• W2978365280 cites W2957991552 @default.
• W2978365280 cites W3111651134 @default.
• W2978365280 cites W3114029434 @default.
• W2978365280 cites W3115209132 @default.
• W2978365280 cites W3116478505 @default.
• W2978365280 cites W3120926773 @default.
• W2978365280 doi "https://doi.org/10.1109/tetc.2019.2944590" @default.
• W2978365280 hasPublicationYear "2021" @default.
• W2978365280 type Work @default.
• W2978365280 sameAs 2978365280 @default.
• W2978365280 citedByCount "0" @default.
• W2978365280 crossrefType "journal-article" @default.
• W2978365280 hasAuthorship W2978365280A5020407423 @default.
• W2978365280 hasAuthorship W2978365280A5028356877 @default.
• W2978365280 hasAuthorship W2978365280A5046691899 @default.
• W2978365280 hasAuthorship W2978365280A5072675590 @default.
• W2978365280 hasAuthorship W2978365280A5074272792 @default.
• W2978365280 hasAuthorship W2978365280A5080960636 @default.
• W2978365280 hasConcept C111919701 @default.
• W2978365280 hasConcept C119599485 @default.
• W2978365280 hasConcept C127413603 @default.
• W2978365280 hasConcept C134146338 @default.
• W2978365280 hasConcept C149635348 @default.
• W2978365280 hasConcept C150012182 @default.
• W2978365280 hasConcept C165005293 @default.
• W2978365280 hasConcept C168065819 @default.
• W2978365280 hasConcept C17626397 @default.
• W2978365280 hasConcept C190874656 @default.
• W2978365280 hasConcept C199360897 @default.
• W2978365280 hasConcept C200601418 @default.
• W2978365280 hasConcept C2779960059 @default.
• W2978365280 hasConcept C41008148 @default.
• W2978365280 hasConcept C51234621 @default.
• W2978365280 hasConcept C530198007 @default.
• W2978365280 hasConcept C76155785 @default.
• W2978365280 hasConcept C9390403 @default.
• W2978365280 hasConceptScore W2978365280C111919701 @default.
• W2978365280 hasConceptScore W2978365280C119599485 @default.
• W2978365280 hasConceptScore W2978365280C127413603 @default.
• W2978365280 hasConceptScore W2978365280C134146338 @default.
• W2978365280 hasConceptScore W2978365280C149635348 @default.
• W2978365280 hasConceptScore W2978365280C150012182 @default.
• W2978365280 hasConceptScore W2978365280C165005293 @default.
• W2978365280 hasConceptScore W2978365280C168065819 @default.
• W2978365280 hasConceptScore W2978365280C17626397 @default.
• W2978365280 hasConceptScore W2978365280C190874656 @default.
• W2978365280 hasConceptScore W2978365280C199360897 @default.
• W2978365280 hasConceptScore W2978365280C200601418 @default.
• W2978365280 hasConceptScore W2978365280C2779960059 @default.
• W2978365280 hasConceptScore W2978365280C41008148 @default.
• W2978365280 hasConceptScore W2978365280C51234621 @default.
• W2978365280 hasConceptScore W2978365280C530198007 @default.
• W2978365280 hasConceptScore W2978365280C76155785 @default.
• W2978365280 hasConceptScore W2978365280C9390403 @default.
• W2978365280 hasIssue "2" @default.
• W2978365280 hasLocation W29783652801 @default.
• W2978365280 hasOpenAccess W2978365280 @default.
• W2978365280 hasPrimaryLocation W29783652801 @default.
• W2978365280 hasRelatedWork W11201533 @default.
• W2978365280 hasRelatedWork W12703013 @default.
• W2978365280 hasRelatedWork W14148344 @default.
• W2978365280 hasRelatedWork W2526871 @default.
• W2978365280 hasRelatedWork W2988963 @default.
• W2978365280 hasRelatedWork W4350478 @default.
• W2978365280 hasRelatedWork W4357490 @default.
• W2978365280 hasRelatedWork W532353 @default.
• W2978365280 hasRelatedWork W6340901 @default.
• W2978365280 hasRelatedWork W6572092 @default.
• W2978365280 hasVolume "9" @default.
• W2978365280 isParatext "false" @default.

• next