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- W2984751330 endingPage "1329" @default.
- W2984751330 startingPage "1279" @default.
- W2984751330 abstract "This chapter illustrates how electron tomography has become a technique of primary importance in the three-dimensional () microscopic analysis of materials. The foundations of tomography are set out with descriptions of the Radon transform and its inverse and its relationship to the Fourier transform and the Fourier slice theorem. The acquisition of a tilt series of images is described and how the angular sampling in the series affects the overall 3-D resolution in the tomogram. The imaging modes available in the (scanning) transmission electron microscope are explored with reference to their application in electron tomography and how each mode can provide complementary information on the structural, chemical, electronic, and magnetic properties of the material studied. The chapter also sets out in detail methods for tomographic reconstruction from backprojection and iterative methods, such as simultaneous iterative reconstruction technique ( simultaneous iterative reconstruction technique (SIRT) ) and algebraic reconstruction technique ( algebraic reconstruction technique (ART) ), through to more recent compressed sensing approaches that aim to build in prior knowledge about the specimen into the reconstruction process. The chapter concludes with a look to the future." @default.
- W2984751330 created "2019-11-22" @default.
- W2984751330 creator A5023271151 @default.
- W2984751330 creator A5029035232 @default.
- W2984751330 date "2019-01-01" @default.
- W2984751330 modified "2023-09-25" @default.
- W2984751330 title "Electron Tomography in Materials Science" @default.
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