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- W2986298927 abstract "The rapid growth of process automation requires that more efficient and reliable system testing and fault diagnosis techniques be developed to reduce machine down time and enhance productivity. As a design philosophy built-in-test (BIT) is receiving increasing attention. This paper presents an overview of diverse BIT applications in several areas of industry, including manufacturing, aerospace, and transportation." @default.
- W2986298927 created "2019-11-22" @default.
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- W2986298927 date "2002-11-13" @default.
- W2986298927 modified "2023-09-23" @default.
- W2986298927 title "BIT for intelligent system design and condition monitoring" @default.
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- W2986298927 doi "https://doi.org/10.1109/imtc.2001.929458" @default.
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