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- W2989492039 abstract "The design and fabricstion of several families of parasitic transistors available in a standard CMOS process are discussed and their application to process control examined. These transistors are characterised and their extracted parame- ters correlated with those obtained from CMOS devices. From these correlations it is concluded that parasitic transistors can be used to provide a more complete picture of CMOS pro- cess variation." @default.
- W2989492039 created "2019-11-22" @default.
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- W2989492039 date "1989-01-01" @default.
- W2989492039 modified "2023-09-27" @default.
- W2989492039 title "ChlOS PROCESS UNIFORMITY EVALUATION THROUGH THE CHARACTERISATION OF PARASITIC TRANSISTORS" @default.
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